Enhanced optical properties of Si1-xGex alloy nanocrystals in a planar microcavity

被引：4

作者：

Toshikiyo, K

Fujii, M ^{[1
]}

Hayashi, S

机构：

[1] Kobe Univ, Fac Engn, Dept Elect & Elect Engn, Nada Ku, Kobe, Hyogo 6578501, Japan

[2] Kobe Univ, Grad Sch Sci & Technol, Nada Ku, Kobe, Hyogo 6578501, Japan

来源：

JOURNAL OF APPLIED PHYSICS | 2003年 / 93卷 / 04期

关键词：

D O I：

10.1063/1.1539289

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The emission properties of Si1-xGex alloy nanocrystals (nc-Si1-xGex) in an optical microcavity were studied, and the results were compared with those of nc-Si in the same structure. The cavity consists of two distributed Si/SiO2 Bragg reflectors (DBRs) sandwiching a thin SiO2 film containing nc-Si1-xGex. The commonly observed cavity effects, that is, spectral narrowing, high directionality, and photoluminescence (PL) enhancement in the normal direction, were observed. In nc-Si1-xGex, PL lifetime was lengthened by cavity formation, while that of nc-Si was shortened. This difference is due to the different dielectric contrast between active layers and DBRs. (C) 2003 American Institute of Physics.

引用

页码：2178 / 2181

页数：4

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