Enhanced optical properties of Si1-xGex alloy nanocrystals in a planar microcavity

被引：4
|
作者：
Toshikiyo, K
Fujii, M [1 ]
Hayashi, S
机构：
[1] Kobe Univ, Fac Engn, Dept Elect & Elect Engn, Nada Ku, Kobe, Hyogo 6578501, Japan
[2] Kobe Univ, Grad Sch Sci & Technol, Nada Ku, Kobe, Hyogo 6578501, Japan
来源：
JOURNAL OF APPLIED PHYSICS | 2003年 / 93卷 / 04期
关键词：
D O I：
10.1063/1.1539289
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The emission properties of Si1-xGex alloy nanocrystals (nc-Si1-xGex) in an optical microcavity were studied, and the results were compared with those of nc-Si in the same structure. The cavity consists of two distributed Si/SiO2 Bragg reflectors (DBRs) sandwiching a thin SiO2 film containing nc-Si1-xGex. The commonly observed cavity effects, that is, spectral narrowing, high directionality, and photoluminescence (PL) enhancement in the normal direction, were observed. In nc-Si1-xGex, PL lifetime was lengthened by cavity formation, while that of nc-Si was shortened. This difference is due to the different dielectric contrast between active layers and DBRs. (C) 2003 American Institute of Physics.
引用
收藏
页码：2178 / 2181
页数：4
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