Enhanced optical properties of Si1-xGex alloy nanocrystals in a planar microcavity

被引:4
|
作者
Toshikiyo, K
Fujii, M [1 ]
Hayashi, S
机构
[1] Kobe Univ, Fac Engn, Dept Elect & Elect Engn, Nada Ku, Kobe, Hyogo 6578501, Japan
[2] Kobe Univ, Grad Sch Sci & Technol, Nada Ku, Kobe, Hyogo 6578501, Japan
关键词
D O I
10.1063/1.1539289
中图分类号
O59 [应用物理学];
学科分类号
摘要
The emission properties of Si1-xGex alloy nanocrystals (nc-Si1-xGex) in an optical microcavity were studied, and the results were compared with those of nc-Si in the same structure. The cavity consists of two distributed Si/SiO2 Bragg reflectors (DBRs) sandwiching a thin SiO2 film containing nc-Si1-xGex. The commonly observed cavity effects, that is, spectral narrowing, high directionality, and photoluminescence (PL) enhancement in the normal direction, were observed. In nc-Si1-xGex, PL lifetime was lengthened by cavity formation, while that of nc-Si was shortened. This difference is due to the different dielectric contrast between active layers and DBRs. (C) 2003 American Institute of Physics.
引用
收藏
页码:2178 / 2181
页数:4
相关论文
共 50 条
  • [1] Enhanced optical properties of Si1-xGex alloy nanocrystals in a planar microcavity
    Fujii, M. (fujii@eedept.kobe-u.ac.jp), 1600, American Institute of Physics Inc. (93):
  • [2] Enhanced optical properties of Si nanocrystals in planar microcavity
    Toshikiyo, K
    Fujii, M
    Hayashi, S
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2003, 17 (1-4): : 451 - 452
  • [3] Photoluminescence from Si1-xGex alloy nanocrystals
    Takeoka, S
    Toshikiyo, K
    Fujii, M
    Hayashi, S
    Yamamoto, K
    PHYSICAL REVIEW B, 2000, 61 (23) : 15988 - 15992
  • [4] Optical properties of Si1-xGex/Si thin films
    Kadri, Emna
    Krichen, Monem
    Elleuch, Slim
    Ben Arab, Adel
    OPTICAL AND QUANTUM ELECTRONICS, 2016, 48 (07)
  • [5] Structural and optical properties of Si/Si1-xGex wires
    Zhuang, Y
    Schelling, C
    Stangl, J
    Penn, C
    Senz, S
    Schäffler, F
    Roch, T
    Daniel, A
    Grenzer, J
    Pietsch, U
    Bauer, G
    THIN SOLID FILMS, 2000, 369 (1-2) : 409 - 413
  • [6] Optical characteristics of laser-crystallized Si1-xGex nanocrystals
    Huang, SH
    Ma, XY
    Wang, XJ
    Lu, F
    NANOTECHNOLOGY, 2003, 14 (01) : 25 - 28
  • [7] Structural and electronic properties of Si1-xGex alloy nanowires
    Iori, Federico
    Ossicini, Stefano
    Rurali, Riccardo
    JOURNAL OF APPLIED PHYSICS, 2014, 116 (15)
  • [8] Electronic structure and optical properties of Si1-xGex alloys
    Ben Zid, F
    Bhouri, A
    Mejri, H
    Said, M
    Bouarissa, N
    Lazzari, JL
    d'Avitaya, FA
    Derrien, J
    PHYSICA B-CONDENSED MATTER, 2002, 322 (3-4) : 225 - 235
  • [9] Optical properties of strained and relaxed Si1-xGex alloys
    Kim, KJ
    Bahng, JH
    Park, JH
    Kwak, CY
    Kim, HS
    Hwang, YT
    Lee, HJ
    Park, HJ
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1996, 29 (05) : 653 - 657
  • [10] Si1-xGex photodiode with segregated Ge nanocrystals
    Ouyang, Yao-Tsung
    Hsieh, Hsien-Chien
    Lin, Po-Chen
    Tseng, Tsan-Hsien
    Ku, Ching-Shun
    Lee, Hsin-Yi
    Wu, Albert T.
    MATERIALS LETTERS, 2016, 184 : 308 - 311