Atomic force microscopy analysis of surface topography of pure thin aluminum films (vol 5, 046416, 2018)

被引：0
|
作者：
Mwema, F. M. [1 ]
Oladijo, O. P. [1 ,2 ]
Sathiaraj, T. S. [2 ]
Akinlabi, E. T. [1 ]
机构：
[1] Univ Johannesburg, FEBE, Dept Mech Engn Sci, Kingsway Campus 524, ZA-2006 Johannesburg, South Africa
[2] Botswana Int Univ Sci & Technol, Private Bag 16, Palapye, Botswana
来源：
MATERIALS RESEARCH EXPRESS | 2019年 / 6卷 / 09期
关键词：
D O I：
10.1088/2053-1591/ab2f97
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页数：2
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