Topography and friction properties of macromolecular thin films using atomic-force-microscopy technology

被引：0
|
作者：
Y.W. Chen
D.J. Gan
S. Kreiling
C.S. Song
S.Q. Lu
Z.J. Wang
机构：
[1] Department of Chemistry,
[2] Jiangxi Normal University,undefined
[3] 330027 Nanchang,undefined
[4] P.R. China,undefined
来源：
Applied Physics A | 2003年 / 76卷
关键词：
PACS: 07.79.Lh; 62.20.Qp; 81.05.Lg; 81.20.Ka; 81.40.Pq;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The research work in this letter is on the microtribological properties of poly(ether ketone ketone) (PEKK) and sulfonated PEKK (S-PEKK) thin films. Polystyrene (PS) was used as a reference for the investigation. Atomic-force-microscopy (AFM) techniques were used for observing the topography and friction properties of the macromolecular thin films at the nanometer scale. The polymeric thin films were fabricated by spin coating at a speed of 4000 rotations per minute (rpm).
引用
收藏
页码：129 / 132
页数：3
相关论文
共 50 条
  • [1] Topography and friction properties of macromolecular thin films using atomic-force-microscopy technology
    Chen, YW
    Gan, DJ
    Kreiling, S
    Song, CS
    Lu, SQ
    Wang, ZJ
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2003, 76 (01): : 129 - 132
  • [2] Atomic-force-microscopy studies of phase separations in macromolecular systems
    Kuznetsov, YG
    Malkin, AJ
    McPherson, A
    [J]. PHYSICAL REVIEW B, 1998, 58 (10) : 6097 - 6103
  • [3] Micro/nanoscale friction and wear mechanisms of thin films using atomic force and friction force microscopy
    Bhushan, B
    Sundararajan, S
    [J]. ACTA MATERIALIA, 1998, 46 (11) : 3793 - 3804
  • [4] Observations of the topography and friction properties of macromolecular thin films at the nanometer scale
    Shi, B
    Lu, XC
    Zou, R
    Luo, JB
    Chen, DR
    Liang, H
    Huang, L
    [J]. WEAR, 2001, 251 : 1177 - 1182
  • [5] Scratch properties of nickel thin films using atomic force microscopy
    Tseng, Ampere A.
    Shirakashi, Jun-ichi
    Jou, Shyankay
    Huang, Jen-Ching
    Chen, T. P.
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2010, 28 (01): : 202 - 210
  • [6] Atomic-force-microscopy nanowriting on ultrathin tetrahedral amorphous carbon films
    Pivovarov, Pavel A.
    Zavedeev, Evgeny V.
    Frolov, Vadim D.
    Roch, Teja
    Scheibe, Hans-Joachim
    Pimenov, Sergei M.
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2016, 122 (11):
  • [7] ELASTICITY, WEAR, AND FRICTION PROPERTIES OF THIN ORGANIC FILMS OBSERVED WITH ATOMIC-FORCE MICROSCOPY
    OVERNEY, RM
    BONNER, T
    MEYER, E
    REUTSCHI, M
    LUTHI, R
    HOWALD, L
    FROMMER, J
    GUNTHERODT, HJ
    FUJIHARA, M
    TAKANO, H
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03): : 1973 - 1976
  • [8] Atomic force microscopy analysis of surface topography of pure thin aluminum films
    Mwema, F. M.
    Oladijo, O. P.
    Sathiaraj, T. S.
    Akinlabi, E. T.
    [J]. MATERIALS RESEARCH EXPRESS, 2018, 5 (04)
  • [9] Atomic-force-microscopy nanowriting on ultrathin tetrahedral amorphous carbon films
    Pavel A. Pivovarov
    Evgeny V. Zavedeev
    Vadim D. Frolov
    Teja Roch
    Hans-Joachim Scheibe
    Sergei M. Pimenov
    [J]. Applied Physics A, 2016, 122
  • [10] Measuring the thermal properties of photoresist thin films using atomic force microscopy
    Kawai, A
    [J]. THIN SOLID FILMS, 1996, 273 (1-2) : 308 - 311
12345