Synthesis and electrical characterization of tungsten oxide nanowires

被引:24
|
作者
Huang Rui [1 ]
Zhu Jing [1 ]
Yu Rong [1 ]
机构
[1] Tsinghua Univ, Beijing Natl Ctr Electron Microscopy, State Key Lab New Ceram & Fine Proc, Adv Mat Lab,Dept Mat Sci & Engn, Beijing 100084, Peoples R China
基金
中国国家自然科学基金;
关键词
tungsten oxide nanowires; chemical vapour deposition (CVD); electrical characterization; metal-semiconductor metal (MSM) structure; FIELD-EMISSION; NANOTUBE; WO3-X; FILMS;
D O I
10.1088/1674-1056/18/7/068
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Tungsten oxide nanowires of diameters ranging from 7 to 200 nm are prepared on a tungsten rod substrate by using the chemical vapour deposition (CVD) method with vapour solid (VS) mechanism. Tin powders are used to control oxygen concentration in the furnace, thereby assisting the growth of the tungsten oxide nanowires. The grown tungsten oxide nanowires are determined to be of crystalline W18O49. I-V curves are measured by an in situ transmission electron microscope (TEM) to investigate the electrical properties of the nanowires. All of the I-V curves observed are symmetric, which reveals that the tungsten oxide nanowires are semiconducting. Quantitative analyses of the experimental I-V curves by using a metal semiconductor-metal (MSM) model give some intrinsic parameters of the tungsten oxide nanowires, such as the carrier concentration, the carrier mobility and the conductivity.
引用
收藏
页码:3024 / 3030
页数:7
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