共 50 条
- [1] PB-FREE THIN SMALL OUTLINE PACKAGE (TSOP) BOARD LEVEL RELIABILITY STUDY IPACK 2009: PROCEEDINGS OF THE ASME INTERPACK CONFERENCE 2009, VOL 1, 2010, : 775 - 780
- [2] Investigation of Thin Small Outline Package (TSOP) Solder Joint Crack after Accelerated Thermal Cycling Testing 2009 INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2009), 2009, : 843 - +
- [3] Board level reliability assessments of package on package 2007 INTERNATIONAL CONFERENCE ON ELECTRONIC MATERIALS AND PACKAGING, 2007, : 454 - 460
- [4] A Study of Wafer Level Package Board Level Reliability 2013 IEEE 63RD ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2013, : 1204 - 1209
- [5] Parameters Optimization of Copper Wire Bonding on Thin Small Outline Package JOURNAL OF METALS MATERIALS AND MINERALS, 2013, 23 (01): : 13 - 17
- [6] Study on the board level reliability test of package on package (PoP) with 2nd level underfill 57TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2007 PROCEEDINGS, 2007, : 1905 - +
- [7] Package & Board Level Reliability Study of 0.35mm Fine Pitch Wafer Level Package 2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2017, : 322 - 326
- [9] Board Level Reliability of Novel Fan-in Package on Package(PoP) IEEE 9TH VLSI PACKAGING WORKSHOP IN JAPAN, 2008, : 57 - +
- [10] Research on Reliability of Board Level Package-on-Package in Drop Test 2010 11TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP), 2010, : 1138 - 1141