共 50 条
- [21] A double lamellae dropoff etching procedure for tungsten tips attached to tuning fork atomic force microscopy/scanning tunneling microscopy sensors REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (02): : 1027 - 1030
- [23] Spring constant of a tuning-fork sensor for dynamic force microscopy BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2012, 3 : 809 - 816
- [26] A DETECTION TECHNIQUE FOR SCANNING FORCE MICROSCOPY REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (04): : 912 - 916
- [27] Electrometer preamplifier for scanning tunneling microscopy REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (07): : 2652 - 2653
- [29] Atomic force microscopy of nickel dot arrays with tuning fork and nanotube probe JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (01): : 323 - 325