CSTBT™ based Split-Gate RC-IGBT with Low Loss and EMI Noise

被引:0
|
作者
Nishi, Koichi [1 ]
Narazaki, Atsushi [1 ]
机构
[1] Mitsubishi Electr Corp, Power Device Works, Nishi Ku, 1-1-1 Imajyuku Higashi, Fukuoka 8190192, Japan
关键词
RC-IGBT; CSTBT; Split-gate; Miller capacitance; Switching loss; EMI noise;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
CSTBT (TM) faces a complex tradeoff among E-on/off-V-CEsat-SOA and EMI noise. We propose a split-gate CSTBT (TM) to break up the complex tradeoff and introduce this novel structure to the RC-IGBT for the first time. The Miller capacitance was drastically reduced by using the proposed structure while maintaining the Blocking Voltage, which contributes to approximately a 15% reduction in total loss without any sacrifices of EMI noise and/or SOA.
引用
收藏
页码:138 / 141
页数:4
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