Reflection electron microscopy of molecular beam epitaxial II-VI and III-V semiconductor surfaces

被引：0
|
作者：
Preis, H [1 ]
Rosenauer, A [1 ]
Zweck, J [1 ]
Gebhardt, W [1 ]
机构：
[1] UNIV REGENSBURG,INST FESTKORPERPHYS,D-93040 REGENSBURG,GERMANY
来源：
EUROPEAN JOURNAL OF CELL BIOLOGY | 1997年 / 74卷
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D O I：
暂无
中图分类号：
Q2 [细胞生物学];
学科分类号：
071009 ; 090102 ;
摘要：
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页码：51 / 51
页数：1
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