Sn-Ag-Cu Soldering Reliability as Influenced by Process Atmosphere

被引:7
|
作者
Baated, Alongheng [1 ]
Jiang, Junxiang [1 ]
Kim, Keun-Soo [1 ]
Suganuma, Katsuaki [1 ]
Huang, Sharon [2 ]
Jurcik, Benjamin [2 ]
Nozawa, Shigeyoshi [2 ]
Ueshima, Minoru [3 ]
机构
[1] Osaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan
[2] Air Liquide Labs, Tsukuba, Ibaraki 3004247, Japan
[3] Senju Met Ind Co Ltd, Tokyo 1208555, Japan
关键词
Atmosphere; reliability; soldering; thermal fatigue test (TFT); wetting behavior; TENSILE PROPERTIES;
D O I
10.1109/TEPM.2009.2035442
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
To develop an optimal surface mount reflow soldering process with Sn-Ag-Cu, the influences of atmosphere and cooling speed on soldering reliability have been examined by using Sn plated chip components and of Pd plated small outline packages (SOPs) on a printed circuit board (PCB). Typical three Sn-Ag-Cu alloy pastes, i.e., Sn-3.0wt% Ag-0.5wt% Cu, Sn-3.8wt% Ag-0.75wt% Cu, and Sn-4.0wt% Ag-0.9wt% Cu, were used for reflow soldering in air or N-2 atmospheres. In the case of chip component joints, the solder compositions, cooling speed, and atmospheres during reflow treatment slightly affect the dendritic microstructure of the solder fillets. In contrast, these parameters rarely affect the solder wettability both on boards/components and shear strengths of the solder joints. In the case of the SOP joints, however, the atmospheres in reflow treatment and the fluxes strongly affect the appearances of solder fillet surfaces structure. Despite the types of solder fluxes, N-2 process atmosphere obviously improved wettability of the solders on the lead-frames of the SOP. Moreover, the scatter in shear strengths becomes smaller and the wetting of solders on the lead-frames becomes stabler in N-2 atmosphere than in air atmosphere.
引用
收藏
页码:38 / 43
页数:6
相关论文
共 50 条
  • [31] Growth of Sn and intermetallic compounds in Sn-Ag-Cu solder
    Lehman, LP
    Athavale, SN
    Fullem, TZ
    Giamis, AC
    Kinyanjui, RK
    Lowenstein, M
    Mather, K
    Patel, R
    Rae, D
    Wang, J
    Xing, Y
    Zavalij, L
    Borgesen, P
    Cotts, EJ
    JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (12) : 1429 - 1439
  • [32] Fatigue Reliability Analysis of Sn-Ag-Cu Solder Joints Subject to Thermal Cycling
    Che, F. X.
    Pang, John H. L.
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2013, 13 (01) : 36 - 49
  • [33] Reliability of Sn-Ag-Cu flip chip package with underfill under thermal shock
    Noh, Bo-In
    Jung, Seung-Boo
    ECO-MATERIALS PROCESSING & DESIGN VII, 2006, 510-511 : 558 - 561
  • [34] Growth of Sn and intermetallic compounds in Sn-Ag-Cu solder
    L. P. Lehman
    S. N. Athavale
    T. Z. Fullem
    A. C. Giamis
    R. K. Kinyanjui
    M. Lowenstein
    K. Mather
    R. Patel
    D. Rae
    J. Wang
    Y. Xing
    L. Zavalij
    P. Borgesen
    E. J. Cotts
    Journal of Electronic Materials, 2004, 33 : 1429 - 1439
  • [35] Effect of cerium addition on board level reliability of Sn-Ag-Cu solder joint
    Wang, Le Liang Qian
    Zhao, Zhenqing
    ICEPT: 2007 8TH INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING TECHNOLOGY, PROCEEDINGS, 2007, : 305 - 308
  • [36] Improved drop reliability of Sn-Ag-Cu solder joints by Zn addition to a Cu wetting layer
    Park, Jae-Yong
    Kim, Young Min
    Kim, Young-Ho
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2015, 26 (08) : 5852 - 5862
  • [37] Drop impact reliability of Cu-Zn/Sn-Ag-Cu/Cu-Zn solder joints
    Kim, Young Min
    Kim, Young-Ho
    2008 EMAP CONFERENCE PROCEEDINGS, 2008, : 236 - 238
  • [38] The growth of intermetallic compounds at Sn-Ag-Cu solder/Cu and Sn-Ag-Cu solder/Ni interfaces and the associated evolution of the solder microstructure
    A. Zribi
    A. Clark
    L. Zavalij
    P. Borgesen
    E. J. Cotts
    Journal of Electronic Materials, 2001, 30 : 1157 - 1164
  • [39] The growth of intermetallic compounds at Sn-Ag-Cu solder/Cu and Sn-Ag-Cu solder/Ni interfaces and the associated evolution of the solder microstructure
    Zribi, A
    Clark, A
    Zavalij, L
    Borgesen, P
    Cotts, EJ
    JOURNAL OF ELECTRONIC MATERIALS, 2001, 30 (09) : 1157 - 1164
  • [40] Sn-Ag-Cu and Sn-Cu solders: interfacial reactions with platinum
    Kim, TH
    Kim, YH
    JOM, 2004, 56 (06) : 45 - 49