共 50 条
- [1] Simultaneous measurements of the thickness and refractive index of microstructures in obscure specimen by optical coherence tomography [J]. OPTIK, 2000, 111 (12): : 541 - 543
- [2] The measurements of refractive index and physical thickness using optical coherence tomography [J]. INTERNATIONAL CONFERENCE ON SENSORS AND CONTROL TECHNIQUES (ICSC 2000), 2000, 4077 : 171 - 174
- [4] Simultaneous analysis of refractive index and physical thickness by Fourier domain optical coherence tomography [J]. IEE PROCEEDINGS-OPTOELECTRONICS, 2006, 153 (05): : 222 - 228
- [5] Evaluation of optical thickness and refractive index of a layered sample by low coherence optical tomography [J]. APOC 2001: ASIA-PACIFIC OPTICAL AND WIRELESS COMMUNICATIONS: OPTICAL FIBER AND PLANAR WAVEGUIDE TECHNOLOGY, 2001, 4579 : 355 - 359