Local Power of Fixed-TPanel Unit Root Tests With Serially Correlated Errors and Incidental Trends

被引:12
|
作者
Karavias, Yiannis [1 ]
Tzavalis, Elias [2 ]
机构
[1] Univ Nottingham, Sch Econ, Nottingham NG7 2RD, England
[2] Athens Univ Econ & Business, Dept Econ, Athens, Greece
关键词
Panel data; unit root; local power functions; serial correlation; incidental trends; JELC22; C23; PANEL-DATA; DYNAMIC PANELS; TIME DIMENSION; INFERENCE; MODELS;
D O I
10.1111/jtsa.12144
中图分类号
O1 [数学];
学科分类号
0701 ; 070101 ;
摘要
The asymptotic local power properties of various fixed Tpanel unit root tests with serially correlated errors and incidental trends are studied. Asymptotic (over N) local power functions are analytically derived, and through them, the effects of general forms of serial correlation are examined. We find that a test based on an instrumental variables (IV) estimator dominates the tests based on the within-groups (WG) estimator. These functions also show that in the presence of incidental trends, an instrumental variables test based on the first differences of the model has non-trivial local power in an N(-1/2)neighbourhood of unity. Furthermore, for a test based on the within-groups estimator, although it is found that it has trivial power in the presence of incidental trends, this ceases to be the case if there is serial correlation as well.
引用
收藏
页码:222 / 239
页数:18
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