Incidental trends and the power of panel unit root tests

被引:58
|
作者
Moon, Hyungsik Roger [1 ]
Perron, Benoit
Phillips, Peter C. B.
机构
[1] Univ So Calif, Dept Econ, Los Angeles, CA 90089 USA
[2] Univ Montreal, CIREQ, Dept Sci Econ, Montreal, PQ H3C 3J7, Canada
[3] Yale Univ, Cowles Fdn, New Haven, CT 06520 USA
[4] Univ Auckland, Auckland 1, New Zealand
[5] Univ York, York YO10 5DD, N Yorkshire, England
[6] Univ Montreal, CIRANO, Montreal, PQ H3C 3J7, Canada
基金
美国国家科学基金会;
关键词
asymptotic power envelope; common point optimal test; incidental trends; local asymptotic power function; panel unit root test;
D O I
10.1016/j.jeconom.2006.10.003
中图分类号
F [经济];
学科分类号
02 ;
摘要
The asymptotic local power of various panel unit root tests is investigated. The (Gaussian) power envelope is obtained under homogeneous and heterogeneous alternatives. The envelope is compared with the asymptotic power functions for the pooled t-test, the Ploberger and Phillips [2002. Optimal testing for unit roots in panel data. Mimeo] test, and a point optimal test in neighborhoods of unity that are of order n(-1/4)T(-1) and n(-1/2)T(-1), depending on whether or not incidental trends are extracted from the panel data. In the latter case, when the alternative hypothesis is homogeneous across individuals, it is shown that the point optimal test and the Ploberger-Phillips test both achieve the power envelope and are uniformly most powerful, in contrast to point optimal unit root tests for time series. Some simulations examining the finite sample performance of the tests are reported. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:416 / 459
页数:44
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