A Bottom-gate Depletion-mode Nanowire Field Effect Transistor (NWFET) Model Including a Schottky Diode Model

被引:3
|
作者
Yu, Y. S. [1 ,2 ]
Lee, S. H. [3 ,4 ]
Kim, D. S. [3 ,4 ]
Jung, Y. C. [3 ,4 ]
Hwang, S. W. [3 ,4 ]
Ahn, D. [5 ]
机构
[1] Hankyong Natl Univ, Dept Informat & Control Engn, Anseong 456749, South Korea
[2] Hankyong Natl Univ, Elect Technol Inst, Anseong 456749, South Korea
[3] Korea Univ, Dept Comp & Elect Engn, Seoul 136075, South Korea
[4] Korea Univ, Res Ctr Time Domain Nanofunct Devices, Seoul 136075, South Korea
[5] Univ Seoul, Inst Quantum Informat Proc & Syst, Seoul 130743, South Korea
关键词
Nanowire field-effect transistor; Schottky diode; Thermionic emission; Thermionic field emission; Equivalent circuit; EQUIVALENT-CIRCUIT MODEL; ELECTRICAL CHARACTERISTICS; SILICON NANOWIRES; FABRICATION;
D O I
10.3938/jkps.55.1162
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We present a compact model for a bottom-gate depletion-mode nanowire field-effect transistor (NWFET) including a Schottky diode model for efficient circuit simulation. The NWFET model is based on an equivalent circuit corresponding to two back-to-back Schottky diodes for the metal-semiconductor (MS) contacts separated by a depletion-mode NWFET for the intrinsic NWFET. The previously developed depletion-mode NWFET model is used for the intrinsic part of the NWFET. The Schottky diode model for the M-S contacts includes the thermionic field emission (TFE) and the thermionic emission (TE) mechanisms for reverse bias and forward bias, respectively. Our newly developed model is integrated into Advanced Design System (ADS), in which the extrinsic part (Schottky diode model) and the intrinsic part of the NWFET are developed by utilizing the symbolically defined device (SDD) for an equation-based nonlinear model. The results simulated from the newly developed NWFET model reproduce the experimental results within 10% errors. The mobilities extracted from the newly developed NWFET model are compared with those extracted from the previously reported NWFET model which replaced the Schottky diodes with series resistances.
引用
收藏
页码:1162 / 1166
页数:5
相关论文
共 50 条
  • [41] Continuous hydrothermal synthesis of nickel oxide nanoplates and their use as nanoinks for p-type channel material in a bottom-gate field-effect transistor
    Takami, Seiichi
    Hayakawa, Ryoma
    Wakayama, Yutaka
    Chikyow, Toyohiro
    NANOTECHNOLOGY, 2010, 21 (13)
  • [42] Vertical enhancement-mode InAs nanowire field-effect transistor with 50-nm wrap gate
    Thelander, Claes
    Froberg, Linus E.
    Rehnstedt, Carl
    Samuelson, Lars
    Wemersson, Lars-Erik
    IEEE ELECTRON DEVICE LETTERS, 2008, 29 (03) : 206 - 208
  • [43] Study on the Hydrogen Effect and Interface/Border Traps of a Depletion-Mode AlGaN/GaN High-Electron-Mobility Transistor with a SiNx Gate Dielectric at Different Temperatures
    Zhao, Dongsheng
    He, Liang
    Wu, Lijuan
    Xiao, Qingzhong
    Liu, Chang
    Chen, Yuan
    He, Zhiyuan
    Yang, Deqiang
    Lv, Mingen
    Cheng, Zijun
    MICROMACHINES, 2024, 15 (02)
  • [44] A New Resistance Model for a Schottky Barrier Diode in CMOS Including N-well Thickness Effect
    Lee, Jaelin
    Kim, Suna
    Hong, Jong-Phil
    Lee, Sang-Gug
    JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2013, 13 (04) : 381 - 386
  • [45] High-performance organic field effect transistor of liquid crystalline organic semiconductor using silver electrodes with bottom-gate top-contact configuration
    Kang, Sabina
    Aburada, Kai
    Hanna, Jun-ichi
    Iino, Hiroaki
    APPLIED PHYSICS EXPRESS, 2023, 16 (09)
  • [46] New silicon carbide Schottky-gate Bipolar Mode Field Effect Transistor (SiC SBMFET) without PN junction
    Kumar, M. Jagadesh
    Bahl, Harsh
    2006 ANNUAL IEEE INDIA CONFERENCE, 2006, : 260 - +
  • [47] A Charge-Based Analytical Model for Gate All Around Junction-Less Field Effect Transistor Including Interface Traps
    Raut, Pratikhya
    Nanda, Umakanta
    ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2022, 11 (05)
  • [48] GaN/SiC heterostructure field-effect transistor model including polarization effects
    Rokn-Abadi, M. Rezaee
    INTERNATIONAL JOURNAL OF THE PHYSICAL SCIENCES, 2010, 5 (11): : 1728 - 1733
  • [49] AlGaN/GaN heterostructure field-effect transistor model including thermal effects
    Albrecht, JD
    Ruden, PP
    Binari, SC
    Ancona, MG
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2000, 47 (11) : 2031 - 2036
  • [50] A Short Channel Double-Gate Junctionless Transistor Model Including the Dynamic Channel Boundary Effect
    Xiao, Ying
    Lin, Xinnan
    Lou, Haijun
    Zhang, Baili
    Zhang, Lining
    Chan, Mansun
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 63 (12) : 4661 - 4667