Nanoscale optical tomography using volume-scanning near-field microscopy

被引：18

作者：

Sun, Jin ^{[1
]}

Schotland, John C. ^{[2
,5
]}

Hillenbrand, Rainer ^{[3
]}

Carney, P. Scott ^{[1
,4
]}

机构：

[1] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA

[2] Univ Penn, Grad Grp Appl Math & Computat Sci, Philadelphia, PA 19104 USA

[3] CIC NanoGUNE Consolider, Nanoopt Lab, Donostia San Sebastian 20018, Spain

[4] Univ Illinois, Coordinated Sci Lab, Urbana, IL 61801 USA

[5] Univ Penn, Dept Bioengn, Philadelphia, PA 19104 USA

来源：

APPLIED PHYSICS LETTERS | 2009年 / 95卷 / 12期

基金：

美国国家科学基金会;

关键词：

DIELECTRIC CONTRAST; INVERSE SCATTERING; EVANESCENT WAVES; RESOLUTION; DIFFRACTION; SUPERRESOLUTION; SURFACE; LIGHT;

D O I：

10.1063/1.3224177

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3224177]

引用

页数：3

共 50 条

[1] Looking at the nanoscale: scanning near-field optical microscopy
De Serio, M
Zenobi, R
Deckert, V
[J]. TRAC-TRENDS IN ANALYTICAL CHEMISTRY, 2003, 22 (02) : 70 - 77
[2] Nanoscale Investigations of Optical Fiber by Using Scattering Scanning Near-Field Optical Microscopy
Tranca, Denis E.
Stoichita, Catalin
Hristu, Radu
Stanciu, Stefan G.
Sammut, Charles V.
Stanciu, George A.
[J]. 2018 20TH ANNIVERSARY INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS (ICTON), 2018,
[3] Nanoscale characterization of ferroelectric domain structures using scanning near-field optical microscopy
Osada, Minoru
Noguchi, Yuji
Katayama, Shingo
Miyayama, Masaru
[J]. TRANSACTIONS OF THE MATERIALS RESEARCH SOCIETY OF JAPAN, VOL 31, NO 1, 2006, 31 (01): : 55 - 59
[4] SCANNING NEAR-FIELD OPTICAL MICROSCOPY
HEINZELMANN, H
POHL, DW
[J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (02): : 89 - 101
[5] Near-field scanning - Optical microscopy
Shiku, H
Dunn, RC
[J]. ANALYTICAL CHEMISTRY, 1999, 71 (01) : 23A - 29A
[6] NEAR-FIELD SCANNING OPTICAL MICROSCOPY
MORRISON, GH
[J]. ANALYTICAL CHEMISTRY, 1989, 61 (19) : A1075 - A1075
[7] Near-field scanning optical microscopy
Buratto, SK
[J]. CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 1996, 1 (04): : 485 - 492
[8] Scanning near-field optical microscopy
Fokas, CS
[J]. NACHRICHTEN AUS CHEMIE TECHNIK UND LABORATORIUM, 1999, 47 (06): : 648 - +
[9] Scanning near-field optical microscopy
Kirstein, S
[J]. CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, 1999, 4 (04) : 256 - 264
[10] Near-field scanning optical microscopy
Dunn, RC
[J]. CHEMICAL REVIEWS, 1999, 99 (10) : 2891 - +

← 1 2 3 4 5 →