Nanoscale optical tomography using volume-scanning near-field microscopy

被引：18
|
作者：
Sun, Jin [1 ]
Schotland, John C. [2 ,5 ]
Hillenbrand, Rainer [3 ]
Carney, P. Scott [1 ,4 ]
机构：
[1] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA
[2] Univ Penn, Grad Grp Appl Math & Computat Sci, Philadelphia, PA 19104 USA
[3] CIC NanoGUNE Consolider, Nanoopt Lab, Donostia San Sebastian 20018, Spain
[4] Univ Illinois, Coordinated Sci Lab, Urbana, IL 61801 USA
[5] Univ Penn, Dept Bioengn, Philadelphia, PA 19104 USA
来源：
APPLIED PHYSICS LETTERS | 2009年 / 95卷 / 12期
基金：
美国国家科学基金会;
关键词：
DIELECTRIC CONTRAST; INVERSE SCATTERING; EVANESCENT WAVES; RESOLUTION; DIFFRACTION; SUPERRESOLUTION; SURFACE; LIGHT;
D O I：
10.1063/1.3224177
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3224177]
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页数：3
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