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Enhanced Interferometric Weak Value Amplification With Multiple Reflection
被引:1
|作者:
Shi, Lixuan
[1
]
Guan, Tian
[2
]
Xu, Yang
[2
]
Qiao, Zhen
[2
]
Li, Zhangyan
[1
]
Guo, Cuixia
[1
]
Ji, Yanhong
[3
]
He, Yonghong
[1
,2
]
Zeng, Nan
[1
,2
]
机构:
[1] Tsinghua Univ, Dept Phys, Beijing 100084, Peoples R China
[2] Tsinghua Univ, Inst Opt Imaging & Sensing, Shenzhen Key Lab Minimal Invas Med Technol, Grad Sch Shenzhen, Shenzhen 518055, Peoples R China
[3] South China Normal Univ, Sch Phys & Telecommun Engn, Guangzhou 510006, Guangdong, Peoples R China
基金:
美国国家科学基金会;
关键词:
Optical sensors;
optical polarization;
quantum optics;
weak measurement;
MEASUREMENT SYSTEM;
OPTIMIZATION;
SPIN;
D O I:
10.1109/LPT.2019.2935264
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
A multiple-reflection scheme was proposed to improve the sensitivity and resolution of interferometric weak measurement by introducing a cuboid prism device in the optical path. Increasing the number of reflection in a total internal reflection weak value amplification (WVA) system resulted in a 3.8 fold improvement in the sensitivity of the central wavelength shift to refractive index unit (RIU) (from 1788 nm/RIU to 6821 nm/RIU). Using the multiple reflection device, a RIU resolution of 2.7 x 10-7 RIU was obtained. The real-time deposition process of dopamine is monitored.
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页码:1557 / 1560
页数:4
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