Enhanced Interferometric Weak Value Amplification With Multiple Reflection

被引:1
|
作者
Shi, Lixuan [1 ]
Guan, Tian [2 ]
Xu, Yang [2 ]
Qiao, Zhen [2 ]
Li, Zhangyan [1 ]
Guo, Cuixia [1 ]
Ji, Yanhong [3 ]
He, Yonghong [1 ,2 ]
Zeng, Nan [1 ,2 ]
机构
[1] Tsinghua Univ, Dept Phys, Beijing 100084, Peoples R China
[2] Tsinghua Univ, Inst Opt Imaging & Sensing, Shenzhen Key Lab Minimal Invas Med Technol, Grad Sch Shenzhen, Shenzhen 518055, Peoples R China
[3] South China Normal Univ, Sch Phys & Telecommun Engn, Guangzhou 510006, Guangdong, Peoples R China
基金
美国国家科学基金会;
关键词
Optical sensors; optical polarization; quantum optics; weak measurement; MEASUREMENT SYSTEM; OPTIMIZATION; SPIN;
D O I
10.1109/LPT.2019.2935264
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A multiple-reflection scheme was proposed to improve the sensitivity and resolution of interferometric weak measurement by introducing a cuboid prism device in the optical path. Increasing the number of reflection in a total internal reflection weak value amplification (WVA) system resulted in a 3.8 fold improvement in the sensitivity of the central wavelength shift to refractive index unit (RIU) (from 1788 nm/RIU to 6821 nm/RIU). Using the multiple reflection device, a RIU resolution of 2.7 x 10-7 RIU was obtained. The real-time deposition process of dopamine is monitored.
引用
收藏
页码:1557 / 1560
页数:4
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