Thermal stability of nitride thin films

被引:557
|
作者
Hultman, L [1 ]
机构
[1] Linkoping Univ, Dept Phys & Measurement Technol, Thin Film Phys Div, S-58183 Linkoping, Sweden
关键词
D O I
10.1016/S0042-207X(00)00143-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper is a review of the thermal stability of state-of-the-art transition metal nitride thin films synthesized by physical vapour deposition techniques. Nitrides are successfully applied as wear-protection coatings for tools and mechanical components, decorative coatings, electrical contacts, and diffusion barriers in electronic devices. The aspects for thermal stability are on phase equilibrium, metal, nitrogen and impurity diffusion, recrystallization, phase separation, interfacial reactions, and oxidation. Microstructurally engineered structures are considered including single-crystals, nanolaminates, metastable alloys, and films in a state of compressive intrinsic stress. Titanium nitride is discussed in detail as a model system for the studies, but results are given also for NbN, AlN, BN, CNx, CrN, TiN-TiB2, Ti(C,N), and (Ti,Al)N films. More than 150 references are included. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:1 / 30
页数:30
相关论文
共 50 条
  • [31] Influence of strain on thermal conductivity of silicon nitride thin films
    Alam, M. T.
    Manoharan, M. P.
    Haque, M. A.
    Muratore, C.
    Voevodin, A.
    JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2012, 22 (04)
  • [32] Magnetron Sputtering of Aluminium Nitride Thin Films for Thermal Management
    Duquenne, Cyril
    Popescu, Bogdhan
    Tessier, Pierre-Yves
    Besland, Marie-Paule
    Scudeller, Yves
    Brylinski, Christian
    Delage, Sylvain
    Djouadi, M-Abdou
    PLASMA PROCESSES AND POLYMERS, 2007, 4 : S1 - S5
  • [33] High temperature thermal properties of thin tantalum nitride films
    Bozorg-Grayeli, Elah
    Li, Zijian
    Asheghi, Mehdi
    Delgado, Gil
    Pokrovsky, Alexander
    Panzer, Matthew
    Wack, Daniel
    Goodson, Kenneth E.
    APPLIED PHYSICS LETTERS, 2011, 99 (26)
  • [34] Thermal stability of tantalum nitride based thin film resistors
    Shostachenko, S. A.
    Zakharchenko, R. V.
    Ryzhuk, R. V.
    Leshchev, S. V.
    2ND INTERNATIONAL TELECOMMUNICATION CONFERENCE ADVANCED MICRO- AND NANOELECTRONIC SYSTEMS AND TECHNOLOGIES, 2019, 498
  • [35] ANALYSIS OF THIN THERMAL SILICON-NITRIDE FILMS ON SILICON
    SOBOLEWSKI, MA
    HELMS, CR
    APPLIED SURFACE SCIENCE, 1987, 30 (1-4) : 210 - 215
  • [36] Thermal stability of magnetron sputtering amorphous carbon nitride films
    Li, JJ
    Zheng, WT
    Jin, ZS
    Gai, TX
    Gu, GR
    Bian, HJ
    Hu, CQ
    VACUUM, 2003, 72 (03) : 233 - 239
  • [37] Improved ambient stability of thermally annealed zinc nitride thin films
    Trapalis, A.
    Farrer, I.
    Kennedy, K.
    Kean, A.
    Sharman, J.
    Heffernan, J.
    AIP ADVANCES, 2020, 10 (03)
  • [38] Origin and thermal stability of HK in FeTaN thin films
    Minor, MK
    Barnard, JA
    JOURNAL OF APPLIED PHYSICS, 1999, 85 (08) : 4565 - 4567
  • [39] Magnetic interactions and thermal stability in CoSm thin films
    Zana, I
    Zangari, G
    IEEE TRANSACTIONS ON MAGNETICS, 2000, 36 (05) : 2345 - 2347
  • [40] Grain growth and thermal stability of Ag thin films
    Shugurov, AR
    Panin, AV
    Chun, HG
    Loginov, BA
    Korus 2005, Proceedings, 2005, : 528 - 531