An in-situ spectroscopic ellipsometry study of the effects of potential on fibrinogen/thrombin

被引:0
|
作者
Walker, Marlon L. [1 ]
Elliot, John T. [2 ]
Reipa, Vytautas [2 ]
机构
[1] Natl Inst Stand & Technol, Surface & Microanal Sci Div, Gaithersburg, MD 20899 USA
[2] Natl Inst Stand & Technol, Div Biochem Sci, Gaithersburg, MD 20899 USA
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
535-COLL
引用
收藏
页数:1
相关论文
共 50 条
  • [1] In-situ spectroscopic ellipsometry of HgCdTe
    Benson, JD
    Cornfeld, AB
    Martinka, M
    Singley, KM
    Derzko, Z
    Shorten, PJ
    Dinan, JH
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1996, 25 (08) : 1406 - 1410
  • [2] Electrodeposition of CdSe films:: In-situ study by spectroscopic ellipsometry
    Reck, J
    Beck, U
    Dohrmann, JK
    [J]. ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-INTERNATIONAL JOURNAL OF RESEARCH IN PHYSICAL CHEMISTRY & CHEMICAL PHYSICS, 2000, 214 : 83 - 93
  • [3] In-situ and real-time protein adsorption study by Spectroscopic Ellipsometry
    Lousinian, S.
    Logothetidis, S.
    [J]. THIN SOLID FILMS, 2008, 516 (22) : 8002 - 8008
  • [4] In-situ protein adsorption study on biofunctionalized surfaces using spectroscopic ellipsometry
    Goyal, Dileep K.
    Subramanian, Anuradha
    [J]. THIN SOLID FILMS, 2010, 518 (08) : 2186 - 2193
  • [5] In-situ ultra-high vacuum spectroscopic ellipsometry
    Fukazawa, T
    Ishihara, K
    Hoshi, Y
    Kawabata, S
    [J]. INTERNATIONAL SYMPOSIUM ON POLARIZATION ANALYSIS AND APPLICATIONS TO DEVICE TECHNOLOGY, 1996, 2873 : 180 - 183
  • [6] In-situ monitor and control using fast spectroscopic ellipsometry
    Woollam, JA
    Gao, X
    Heckens, S
    Hilfiker, JN
    [J]. INTERNATIONAL SYMPOSIUM ON POLARIZATION ANALYSIS AND APPLICATIONS TO DEVICE TECHNOLOGY, 1996, 2873 : 140 - 143
  • [7] Use of in-situ spectroscopic ellipsometry to study the behaviour of metallic surfaces in different solutions
    Van Gils, S
    Le Pen, C
    Blajiev, O
    Melendres, C
    Stijns, E
    Terryn, H
    Hubin, A
    [J]. OPTICAL METROLOGY IN PRODUCTION ENGINEERING, 2004, 5457 : 355 - 365
  • [8] Investigating the thermal effects and oxidation of aluminum alloy 6061 using In-situ spectroscopic ellipsometry
    Sun, Jianing
    Tiwald, Thomas
    [J]. THIN SOLID FILMS, 2023, 766
  • [9] Study on the Electrodeposition of Lead with In-Situ Ellipsometry
    Ren, Xiaolei
    Zhang, Shengtao
    Guo, Lei
    Li, Wenpo
    Lei, Jinglei
    Wang, Yanru
    [J]. INTERNATIONAL JOURNAL OF ELECTROCHEMICAL SCIENCE, 2015, 10 (03): : 2281 - 2290
  • [10] InN growth and annealing investigations using in-situ spectroscopic ellipsometry
    Drago, M
    Schmidtling, T
    Werner, C
    Pristovsek, M
    Pohl, UW
    Richter, W
    [J]. JOURNAL OF CRYSTAL GROWTH, 2004, 272 (1-4) : 87 - 93