共 50 条
- [1] In-situ spectroscopic ellipsometry of HgCdTe [J]. JOURNAL OF ELECTRONIC MATERIALS, 1996, 25 (08) : 1406 - 1410
- [2] Electrodeposition of CdSe films:: In-situ study by spectroscopic ellipsometry [J]. ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-INTERNATIONAL JOURNAL OF RESEARCH IN PHYSICAL CHEMISTRY & CHEMICAL PHYSICS, 2000, 214 : 83 - 93
- [5] In-situ ultra-high vacuum spectroscopic ellipsometry [J]. INTERNATIONAL SYMPOSIUM ON POLARIZATION ANALYSIS AND APPLICATIONS TO DEVICE TECHNOLOGY, 1996, 2873 : 180 - 183
- [6] In-situ monitor and control using fast spectroscopic ellipsometry [J]. INTERNATIONAL SYMPOSIUM ON POLARIZATION ANALYSIS AND APPLICATIONS TO DEVICE TECHNOLOGY, 1996, 2873 : 140 - 143
- [7] Use of in-situ spectroscopic ellipsometry to study the behaviour of metallic surfaces in different solutions [J]. OPTICAL METROLOGY IN PRODUCTION ENGINEERING, 2004, 5457 : 355 - 365
- [9] Study on the Electrodeposition of Lead with In-Situ Ellipsometry [J]. INTERNATIONAL JOURNAL OF ELECTROCHEMICAL SCIENCE, 2015, 10 (03): : 2281 - 2290