An in-situ spectroscopic ellipsometry study of the effects of potential on fibrinogen/thrombin

被引:0
|
作者
Walker, Marlon L. [1 ]
Elliot, John T. [2 ]
Reipa, Vytautas [2 ]
机构
[1] Natl Inst Stand & Technol, Surface & Microanal Sci Div, Gaithersburg, MD 20899 USA
[2] Natl Inst Stand & Technol, Div Biochem Sci, Gaithersburg, MD 20899 USA
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
535-COLL
引用
收藏
页数:1
相关论文
共 50 条
  • [41] Composition control of long wavelength MBE HgCdTe using in-situ spectroscopic ellipsometry
    Edwall, D
    Phillips, J
    Lee, D
    Arias, J
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2001, 30 (06) : 643 - 646
  • [42] Oxygen partial pressure dependence of the SiC oxidation process studied by in-situ spectroscopic ellipsometry
    Kouda, Keiko
    Hijikata, Yasuto
    Yagi, Shuhei
    Yaguchi, Hiroyuki
    Yoshida, Sadafumi
    [J]. JOURNAL OF APPLIED PHYSICS, 2012, 112 (02)
  • [43] IN-SITU SPECTROSCOPIC ELLIPSOMETRY TO CONTROL THE GROWTH OF TI NITRIDE AND CARBIDE THIN-FILMS
    LOGOTHETIDIS, S
    ALEXANDROU, I
    STOEMENOS, J
    [J]. APPLIED SURFACE SCIENCE, 1995, 86 (1-4) : 185 - 189
  • [44] IN-SITU SPECTROSCOPIC ELLIPSOMETRY OF POROUS SILICON LAYERS ANNEALED UNDER ULTRAHIGH-VACUUM
    LARRE, A
    HALIMAOUI, A
    GLOWACKI, F
    FERRIEU, F
    CAMPIDELLI, Y
    BENSAHEL, D
    [J]. APPLIED PHYSICS LETTERS, 1994, 65 (12) : 1566 - 1568
  • [45] In-situ spectroscopic ellipsometry as a tool to characterize Cu-ligated mercaptoalkanoic acid multilayers
    Patron, Alexandra
    Mullen, Thomas
    Causey, Corey
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2018, 255
  • [46] In-situ studies of the growth of amorphous and nanocrystalline silicon using real time spectroscopic ellipsometry
    Levi, DH
    Nelson, BP
    Iwanizcko, E
    Teplin, CW
    [J]. THIN SOLID FILMS, 2004, 455 : 679 - 683
  • [47] In-situ spectroscopic ellipsometry for the real time process control of plasma etching of silicon nitride
    Rosen, IG
    Parent, T
    Fidan, B
    Madhukar, A
    [J]. NONDESTRUCTIVE METHODS FOR MATERIALS CHARACTERIZATION, 2000, 591 : 263 - 268
  • [48] In-situ monitoring of the surface kinetics of the cubic GaN films in MOVPE using spectroscopic ellipsometry
    Taniyasu, Y
    Sato, E
    Sato, H
    Shimoyama, N
    Jia, A
    Shimotomai, M
    Kato, Y
    Kobayashi, M
    Yoshikawa, A
    Takahashi, K
    [J]. BLUE LASER AND LIGHT EMITTING DIODES II, 1998, : 74 - 77
  • [49] In-situ spectroscopic ellipsometry for monitoring the Ti-Si multilayers during growth and annealing
    Logothetidis, S
    Alexandrou, I
    Vouroutzis, N
    [J]. THIN SOLID FILMS, 1996, 275 (1-2) : 44 - 47
  • [50] NANOSCALE DIMENSIONAL CHANGES AND OPTICAL-PROPERTIES OF POLYANILINE MEASURED BY IN-SITU SPECTROSCOPIC ELLIPSOMETRY
    BARBERO, C
    KOTZ, R
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1994, 141 (04) : 859 - 865