共 50 条
- [45] In-situ spectroscopic ellipsometry as a tool to characterize Cu-ligated mercaptoalkanoic acid multilayers [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2018, 255
- [47] In-situ spectroscopic ellipsometry for the real time process control of plasma etching of silicon nitride [J]. NONDESTRUCTIVE METHODS FOR MATERIALS CHARACTERIZATION, 2000, 591 : 263 - 268
- [48] In-situ monitoring of the surface kinetics of the cubic GaN films in MOVPE using spectroscopic ellipsometry [J]. BLUE LASER AND LIGHT EMITTING DIODES II, 1998, : 74 - 77