Laser diffraction method of surface roughness measurement

被引:6
|
作者
Ostafiev, V [1 ]
Sakhno, S [1 ]
Tymchik, G [1 ]
Ostafiev, S [1 ]
机构
[1] UKRAINIAN TECH NATL UNIV,DEPT PRECIS ENGN,KIEV POLYTECH INST,KIEV,UKRAINE
关键词
D O I
10.1016/S0924-0136(96)02741-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Traditional contact probe and stylus methods have been difficult to apply for the measurement of the roughness of sculptured surfaces, especially whose positioned at under high inclination. The laser diffraction method is presented as a method for remote surface roughness measurement that can be used directly on a machine tool or a press for any position of complex sculptured surfaces. This method can be used to measure the surface roughness of various materials, both metals and non-metals, as well as hard ceramic and soft plastic such as for rapid prototyping. The main technical difference of the method suggested is the use of a new optical system and the automatic determination of the luminous radiation reflection coefficient by a proposed analytical dependence. Specifically, the method involves the simultaneous measurement of the mirror reflected radiation beams as well as the scattered spectrum component and then the numerical processing of reflected laser light signal by developed software. The measurement results taken for different machining processes of complex sculptured surfaces have shown a good correlation with the results of stylus methods.
引用
收藏
页码:871 / 874
页数:4
相关论文
共 50 条
  • [41] Rapid measurement of surface roughness for face-milling aluminum using laser scattering and the Taguchi method
    Lo, SP
    Chiu, JT
    Lin, HY
    [J]. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2005, 26 (9-10): : 1071 - 1077
  • [42] MEASUREMENT OF SMALL INSIDE DIAMETERS BY LASER DIFFRACTION METHOD
    KOTULA, A
    [J]. MECHANIK MIESIECZNIK NAUKOWO-TECHNICZNY, 1970, 43 (11): : 614 - &
  • [43] A new in-process measurement method for wafer surface roughness
    Guo, Ruipeng
    Tao, Zhengsu
    [J]. ICEPT: 2007 8TH INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING TECHNOLOGY, PROCEEDINGS, 2007, : 637 - 640
  • [44] A new non-contact measurement method of surface roughness
    Hui, M
    Niu, HB
    [J]. ISTM/99: 3RD INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, 1999, : 886 - 888
  • [45] Core-ring-ratio method for surface roughness measurement
    Lu, Cheng
    [J]. Proceedings of the Asia Pacific Physics Conference, 1988,
  • [46] A Surface Roughness Measurement Method Based on Ultrasonic Nondestructive Evaluations
    Han X.
    Song Y.
    Liu Y.
    Li X.
    [J]. Zhongguo Jixie Gongcheng/China Mechanical Engineering, 2019, 30 (08): : 883 - 889
  • [47] MEASUREMENT OF SURFACE-ROUGHNESS BY LIGHT-SCATTERING METHOD
    THURN, G
    GAST, T
    [J]. TECHNISCHES MESSEN, 1985, 52 (02): : 74 - 78
  • [48] A METHOD FOR SURFACE-ROUGHNESS MEASUREMENT BY MEANS OF LIGHT REFLECTANCE
    SAKAI, I
    SAWABE, M
    [J]. BULLETIN OF THE JAPAN SOCIETY OF PRECISION ENGINEERING, 1982, 16 (02): : 123 - 124
  • [49] Weak-measurement method for surface-roughness estimation
    Qu, Hui-Chao
    Xiao, Ya
    Han, Xin-Hong
    Dong, Shan-Chuan
    Gu, Yong-Jian
    [J]. PHYSICAL REVIEW A, 2022, 105 (06)
  • [50] An implementation method of filtering mean line in surface roughness measurement
    Xu, J. B.
    Wang, S.
    Xie, Y. G.
    Sun, X. L.
    Nie, J. L.
    [J]. INFORMATION SCIENCE AND ELECTRONIC ENGINEERING, 2017, : 191 - 194