MEASUREMENT OF SMALL INSIDE DIAMETERS BY LASER DIFFRACTION METHOD

被引：0
|
作者：
KOTULA, A
机构：
来源：
MECHANIK MIESIECZNIK NAUKOWO-TECHNICZNY | 1970年 / 43卷 / 11期
关键词：
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
引用
收藏
页码：614 / &
相关论文
共 50 条
  • [1] MEASUREMENT OF ACTIVATED SLUDGE PARTICLE DIAMETERS USING LASER DIFFRACTION METHOD
    Bieganowski, Andrzej
    Lagod, Grzegorz
    Ryzak, Magdalena
    Montusiewicz, Agnieszka
    Chomczynska, Mariola
    Sochan, Agata
    [J]. ECOLOGICAL CHEMISTRY AND ENGINEERING S-CHEMIA I INZYNIERIA EKOLOGICZNA S, 2012, 19 (04): : 597 - 608
  • [2] Measurement of fiber diameters by the diffraction method
    McNicholas, HJ
    Curtis, HJ
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1931, 2 (05): : 263 - 286
  • [3] Measurement of fiber diameters by the diffraction method
    McNicholas, HJ
    Curtis, HJ
    [J]. BUREAU OF STANDARDS JOURNAL OF RESEARCH, 1931, 6 (4/6): : 717 - 734
  • [4] USE OF DIFFRACTION OPTICS IN MEASUREMENT OF DIAMETERS OF SMALL WAVES
    KOCHSIEK, M
    KUNZMANN, H
    TANTAU, J
    [J]. PTB-MITTEILUNGEN, 1977, 87 (04): : 279 - 282
  • [5] MEASUREMENT OF FIBER DIAMETERS BY DIFFRACTION
    EDGE, RD
    ABRAMS, RB
    [J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1977, 22 (03): : 493 - 493
  • [6] Laser diffraction method of surface roughness measurement
    Ostafiev, V
    Sakhno, S
    Tymchik, G
    Ostafiev, S
    [J]. JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 1997, 63 (1-3) : 871 - 874
  • [7] Accurate measurement of small Gaussian laser beam diameters using various rulings
    Cherri, AK
    Alam, MS
    [J]. OPTICS COMMUNICATIONS, 2003, 223 (4-6) : 255 - 262
  • [8] Laser measurement of fine wires diameters
    Liu, LJ
    Zhao, H
    Lu, YL
    Lei, X
    [J]. JOINT CONFERENCE OF 96' AICDEI / 4T-JCCEID, 1996, : 445 - 448
  • [9] LASER GAUGE FOR THE MEASUREMENT OF FIBER DIAMETERS
    KULESH, VP
    MOSKALIK, LM
    [J]. MEASUREMENT TECHNIQUES USSR, 1994, 37 (09): : 1065 - 1068
  • [10] Fresnel diffraction sensor for in-process measurement of diameters
    Huhnke, B
    [J]. TECHNISCHES MESSEN, 1998, 65 (02): : 43 - 47
12345