Circuit lines for guiding the generation of random test sequences for synchronous sequential circuits

被引：0

作者：

Pomeranz, Irith ^{[1
]}

Reddy, Sudhakar M. ^{[2
]}

机构：

[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA

[2] Univ Iowa, Elect & Comp Eng Dept, Iowa City, IA 52242 USA

来源：

2008 ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2 | 2008年

关键词：

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

A procedure proposed earlier for improving the fault coverage of a random primary input sequence modifies the input sequence so as to avoid repeated synchronization of state variables. We show that in addition to the values of state variables, it is also important to consider repeated setting of other lines to the same values. A procedure and experimental results are presented to demonstrate the improvements in fault coverage of random primary input sequences when the values of selected lines are considered.

引用

页码：607 / +

页数：2

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