Nanometer resolution of liquid surfaces topography by scanning force microscopy

被引:0
|
作者
Fery, A [1 ]
Pompe, T [1 ]
Herminghaus, S [1 ]
机构
[1] Max Planck Inst Colloids & Interfaces, D-12489 Berlin, Germany
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
074-COLL
引用
收藏
页码:U604 / U604
页数:1
相关论文
共 50 条
  • [1] Nanometer resolution of liquid surface topography by scanning force microscopy
    Fery, A
    Pompe, T
    Herminghaus, S
    [J]. JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 1999, 13 (10) : 1071 - 1083
  • [2] Nanometer resolution of liquid surface topography by scanning force microscopy
    Fery, A
    Pompe, T
    Herminghaus, S
    [J]. APPARENT AND MICROSCOPIC CONTACT ANGLES, 2000, : 13 - 25
  • [3] Atomic and chemical resolution in scanning force microscopy on ionic surfaces
    Livshits, AI
    Shluger, AL
    [J]. APPLIED SURFACE SCIENCE, 1999, 141 (3-4) : 274 - 286
  • [4] Acoustic phase velocity measurements with nanometer resolution by scanning acoustic force microscopy
    E. Chilla
    T. Hesjedal
    H.-J. Fröhlich
    [J]. Applied Physics A, 1998, 66 : S223 - S226
  • [5] Acoustic phase velocity measurements with nanometer resolution by scanning acoustic force microscopy
    Chilla, E
    Hesjedal, T
    Frohlich, HJ
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S223 - S226
  • [6] Imaging liquid structures on inhomogeneous surfaces by scanning force microscopy
    Pompe, T
    Fery, A
    Herminghaus, S
    [J]. LANGMUIR, 1998, 14 (10) : 2585 - 2588
  • [7] Roughness scores using scanning force microscopy - Characterization surfaces on Micrometer and nanometer scales
    Vinzelberg, S
    [J]. MATERIALPRUFUNG, 1998, 40 (1-2): : 21 - 23
  • [8] Scanning nonlinear dielectric microscopy with nanometer resolution
    Cho, Y
    Kazuta, S
    Matsuura, K
    [J]. APPLIED PHYSICS LETTERS, 1999, 75 (18) : 2833 - 2835
  • [9] Scanning nonlinear dielectric microscopy with nanometer resolution
    Cho, Y
    Kazuta, S
    Matsuura, K
    Odagawa, H
    [J]. PROCEEDINGS OF THE 2001 12TH IEEE INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS, VOLS I AND II, 2001, : 279 - 282
  • [10] Scanning nonlinear dielectric microscopy with nanometer resolution
    Cho, Y
    Kazuta, S
    Matsuura, K
    Odagawa, H
    [J]. JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2001, 21 (10-11) : 2131 - 2134