Atomic and chemical resolution in scanning force microscopy on ionic surfaces

被引：7
|
作者：
Livshits, AI [1 ]
Shluger, AL [1 ]
机构：
[1] Univ London Univ Coll, Dept Phys & Astron, London WC1E 6BT, England
来源：
APPLIED SURFACE SCIENCE | 1999年 / 141卷 / 3-4期
基金：
英国工程与自然科学研究理事会;
关键词：
scanning force microscopy; theory; ionic crystals; tip-surface integration;
D O I：
10.1016/S0169-4332(98)00513-3
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
We present the results of theoretical modelling concerning the possibility to obtain atomic and chemical resolution in contact and non-contact mode Scanning Force Microscopy (SFM) and discuss a related issue of a working model for interpretation of SFM images. As a prototype system we consider the interactions of hard oxide tips with softer alkali halide surfaces in UHV. We briefly review the results of the molecular dynamics (MD) modelling of contact SFM and test some of the assumptions of intuitive SFM models. Then we illustrate the shortcomings of contact SFM by considering an image of a point defect. The mechanism of resolution in non-contact SFM and the effect of avalanche tip-surface adhesion are discussed next. A model image of an impurity defect in non-contact SFM is presented. Finally, the status of SFM with atomic resolution is discussed. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：274 / 286
页数：13
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