Simulation of radiated narrow band electromagnetic interference for components in the Automotive industry. (Bulk Current Injection)

被引：0
|
作者：
Kunkel, H [1 ]
Klezar, S [1 ]
机构：
[1] EM TEST AG, D-4153 Reinach, Germany
来源：
PROCEEDINGS OF THE 8TH INTERNATIONAL CONFERENCE ON ELECTROMAGNETIC INTERFERENCE AND COMPATIBILITY | 2003年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：245 / 248
页数：4
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