Wavelength-scanning Digital Holographic Method

被引：0
|
作者：
Ding, Yilei [1 ]
Yu, Yingjie [1 ]
机构：
[1] Shanghai Univ, Lab Appl Opt & Metrol, Dept Precis Mech Engn, Shanghai 200072, Peoples R China
来源：
SIXTH INTERNATIONAL CONFERENCE ON OPTICAL AND PHOTONIC ENGINEERING (ICOPEN 2018) | 2018年 / 10827卷
关键词：
Wavelength-scanning; Digital holography; Tomographic reconstruction; TOMOGRAPHY; OBJECT;
D O I：
10.1117/12.2500864
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Surface and internal defects of object are one of the most important reasons causing product quality problems and failures, including micro-cracks, micro-scratches, nano-deposition particles. In order to obtain the multi-layer information of the object, this paper proposes the wavelength-scanning digital holographic method. The algorithm is simulated to analyze the feasibility of acquiring the layered information of objects and the separation effect. Compared with the micro-hologram by compressive sensor, the result shows that digital holographic tomography based on wavelength scanning has a good separation effect on multi-layer object information and defects can be detected clearly.
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页数：6
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