Wavelength-scanning Digital Holographic Method

被引：0

作者：

Ding, Yilei ^{[1
]}

Yu, Yingjie ^{[1
]}

机构：

[1] Shanghai Univ, Lab Appl Opt & Metrol, Dept Precis Mech Engn, Shanghai 200072, Peoples R China

来源：

SIXTH INTERNATIONAL CONFERENCE ON OPTICAL AND PHOTONIC ENGINEERING (ICOPEN 2018) | 2018年 / 10827卷

关键词：

Wavelength-scanning; Digital holography; Tomographic reconstruction; TOMOGRAPHY; OBJECT;

D O I：

10.1117/12.2500864

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Surface and internal defects of object are one of the most important reasons causing product quality problems and failures, including micro-cracks, micro-scratches, nano-deposition particles. In order to obtain the multi-layer information of the object, this paper proposes the wavelength-scanning digital holographic method. The algorithm is simulated to analyze the feasibility of acquiring the layered information of objects and the separation effect. Compared with the micro-hologram by compressive sensor, the result shows that digital holographic tomography based on wavelength scanning has a good separation effect on multi-layer object information and defects can be detected clearly.

引用

页数：6

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