CdZnTe detector as an x-ray spectrometer

In this study, we evaluated a CdZnTe (CZT) detector as an x-ray spectrometer. The output of the semiconductor detector is basically distorted due to the processes of energy deposition, charge generation and pulse processing. In addition, the distortion due to the charge transport process must be taken into account when using a CZT detector. First, we calculated response functions of the CZT detector using the EGS4. In the code, the Hecht equation was utilized to deal with the trapping of charge carriers during charge transport. The parameters in the equation, mean free, path of charge carriers, were determined to make the calculated response functions the same as the measured response to mono-energetic gamma-rays. Secondly, we corrected x-ray spectra using the calculated response functions. The stripping method was employed in the correction procedure. The results indicate that a CZT detector is useful in x-ray spectrometry with the proper corrections.