Built-in reduction of statistical fluctuations of partitioning objects

被引:6
|
作者
DelRe, E. [1 ,2 ]
Crosignani, B. [3 ]
Di Porto, P. [2 ]
Di Sabatino, S. [1 ]
机构
[1] Univ Aquila, Dept Elect & Informat Engn, I-67100 Laquila, Italy
[2] Univ Roma La Sapienza, IPCF CNR, I-00185 Rome, Italy
[3] CALTECH, Dept Appl Phys, Pasadena, CA 91125 USA
来源
PHYSICAL REVIEW E | 2011年 / 84卷 / 02期
关键词
D O I
10.1103/PhysRevE.84.021112
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Our theoretical and numerical investigation of the movement of an object that partitions a microtubule filled with small particles indicates that vibrations warranted by thermal equilibrium are reached only after a time that increases exponentially with the number of particles involved. This points to a basic mechanical process capable of breaching, on accessible time scales, the ultimate ergodic constraints that force randomness on bound microscale and nanoscale systems.
引用
收藏
页数:5
相关论文
共 50 条
  • [1] Anomalous Fluctuations in the Motion of Partitioning Objects
    E. DelRe
    S. Di Sabatino
    P. Di Porto
    B. Crosignani
    [J]. Journal of Statistical Physics, 2014, 156 : 291 - 300
  • [2] Anomalous Fluctuations in the Motion of Partitioning Objects
    DelRe, E.
    Di Sabatino, S.
    Di Porto, P.
    Crosignani, B.
    [J]. JOURNAL OF STATISTICAL PHYSICS, 2014, 156 (02) : 291 - 300
  • [3] Mesoscopic fluctuations of conductance in a depleted built-in channel of a MOSFET
    Aronzon, B. A.
    Vedeneev, A. S.
    Panferov, A. A.
    Ryl'kov, V. V.
    [J]. SEMICONDUCTORS, 2006, 40 (09) : 1055 - 1059
  • [4] Mesoscopic fluctuations of conductance in a depleted built-in channel of a MOSFET
    B. A. Aronzon
    A. S. Vedeneev
    A. A. Panferov
    V. V. Ryl’kov
    [J]. Semiconductors, 2006, 40 : 1055 - 1059
  • [5] Fuzzy-based circuit partitioning in built-in current testing
    Tseng, WD
    Wang, KC
    [J]. PROCEEDINGS OF THE ASP-DAC '97 - ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE 1997, 1996, : 397 - 400
  • [6] The statistical trilemma: built-in limitations of international economic statistics
    Derock, Daniel
    Mugge, Daniel
    [J]. INTERNATIONAL RELATIONS, 2023,
  • [7] Fuzzy-based CMOS circuit partitioning in built-in current testing
    Tseng, WD
    Wang, KC
    [J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 1999, 7 (01) : 116 - 120
  • [8] A partitioning and storage based built-in test pattern generation method for scan circuits
    Pomeranz, I
    Reddy, SM
    [J]. ASP-DAC/VLSI DESIGN 2002: 7TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE AND 15TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS, 2002, : 677 - 682
  • [9] Memory built-in self-repair method based on address partitioning strategy
    Yu, Yang
    Li, Jia-Ming
    Qiao, Li-Yan
    [J]. Tien Tzu Hsueh Pao/Acta Electronica Sinica, 2010, 38 (2A): : 169 - 173
  • [10] A storage-based built-in test pattern generation method for scan circuits based on partitioning and reduction of a precomputed test set
    Pomeranz, I
    Reddy, SM
    [J]. IEEE TRANSACTIONS ON COMPUTERS, 2002, 51 (11) : 1282 - 1293