Implementation and quality testing for compact models implemented in Verilog-A

被引：0

作者：

Mukherjee, Anindya ^{[1
]}

Pawlak, Andreas ^{[1
]}

Schroter, Michael ^{[1
,2
]}

Celi, Didier ^{[3
]}

Huszka, Zoltan ^{[4
]}

机构：

[1] Tech Univ Dresden, CEDIC, D-01062 Dresden, Germany

[2] Univ Calif San Diego, ECE Dept, La Jolla, CA USA

[3] STMicrolectronics, Crolles, France

[4] Ams AG, A-8141 Unterpremstatten, Austria

来源：

PROCEEDINGS OF THE 2016 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE) | 2016年

关键词：

bipolar transistors; compact modeling; HICUM; circuit simulation; modified nodal analysis (MNA); CHARGE-CONTROL RELATION;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

An overview on the implementation of new physical effects into the heterojunction bipolar transistor compact model HICUM/L2 is presented along with a description of the quality testing procedures performed before its public release for production circuit design in commercial simulators. Related topics such as potential measures for model run time improvements and failures are also discussed. Significant differences in run time for different commercial circuit simulators rellect their different approaches towards compact model implementation and solution of the non-linear circuit equation system.

引用

页码：403 / 408

页数：6

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