X-ray absorption studies of phase formation in a Ti/TiN coating on cubic boron nitride

被引:9
|
作者
Piskorska, E
Lawniczak-Jablonska, K
Demchenko, IN
Benko, E
Welter, E
机构
[1] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland
[2] Inst Met Cutting, PL-30011 Krakow, Poland
[3] Tech Univ, PL-43309 Biala, Poland
[4] DESY, HASYLAB, D-22607 Hamburg, Germany
关键词
thin films; vapour deposition; EXAFS; XANES; synchrotron radiation; X-ray spectroscopy;
D O I
10.1016/S0925-8388(03)00580-2
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We report on the use of X-ray absorption spectroscopy as a tool for the identification of the phases formed in the technological process of composite preparation. A composite is a mixture of several compounds and, in many cases, the use of traditional X-ray diffraction to determine the phases can be difficult because of the small amount of phases present. X-ray absorption studies (XANES and EXAFS) of the c-BN Ti/TiN layered system are presented. These materials are models of the powdered composites used in industry for tool production. XANES and EXAFS analyses showed that, after annealing up to 1300 degreesC, a TiB2 phase is formed, but the chemical bonding of the Ti atoms differs slightly from that of standard TiB2 powder, showing the presence of defects in site occupancy. Assuming that the X-ray absorption spectral shape is a linear combination of the spectra of all the components, we estimated the kind and limits of other phase inclusions. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:171 / 177
页数:7
相关论文
共 50 条
  • [1] X-ray absorption studies on cubic boron nitride thin films
    Zhou, X. T.
    Sham, T. K.
    Zhang, W. J.
    Chan, C. Y.
    Bello, I.
    Lee, S. T.
    Hofsass, H.
    [J]. JOURNAL OF APPLIED PHYSICS, 2007, 101 (01)
  • [2] X-ray absorption studies on cubic boron nitride thin films
    Zhou, X.T.
    Sham, T.K.
    Zhang, W.J.
    Chan, C.Y.
    Bello, I.
    Lee, S.T.
    Hofsäss, H.
    [J]. Journal of Applied Physics, 2007, 101 (01):
  • [3] Quantitative phase analysis of cubic boron nitride based composites by X-ray absorption near edge structure
    Piskorska, Edyta
    Lawniczak-Jablonska, Krystyna
    Minikayev, Roman
    Wolska, Anna
    Paszkowicz, Wojciech
    Klimczyk, Piotr
    Benko, Ewa
    [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2007, 62 (05) : 461 - 469
  • [4] INVESTIGATION OF X-RAY SPECTRA OF HEXAGONAL AND CUBIC BORON NITRIDE
    FOMICHEV, VA
    RUMSH, MA
    [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1968, 29 (06) : 1015 - &
  • [5] X-ray diffraction analysis of aluminum nitride sintered with cubic boron nitride
    Bezhenar, NP
    Bozhko, SA
    Belyavina, NN
    Markiv, VY
    [J]. DIAMOND AND RELATED MATERIALS, 1997, 6 (08) : 927 - 930
  • [6] Cubic boron nitride - Ti/TiN composites: hardness and phase equilibrium as function of temperature
    Klimczyk, P
    Benko, E
    Lawniczak-Jablonska, K
    Piskorska, E
    Heinonen, M
    Ormaniec, A
    Gorczynska-Zawislan, W
    Urbanovich, VS
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2004, 382 (1-2) : 195 - 205
  • [7] Powder X-ray Diffraction Electron Density of Cubic Boron Nitride
    Wahlberg, Nanna
    Bindzus, Niels
    Bjerg, Lasse
    Becker, Jacob
    Christensen, Sebastian
    Dippel, Ann-Christin
    Jorgensen, Mads R. V.
    Iversen, Bo B.
    [J]. JOURNAL OF PHYSICAL CHEMISTRY C, 2015, 119 (11): : 6164 - 6173
  • [8] X-RAY STUDY OF STRUCTURAL FEATURES OF CUBIC BORON NITRIDE CRYSTALS
    SOKHOR, MI
    FUTERGEN.SI
    [J]. DOKLADY AKADEMII NAUK SSSR, 1968, 182 (05): : 1071 - &
  • [9] Isotope effects on cubic boron nitride investigated by x-ray scattering
    Fukui, Hiroshi
    Ishikawa, Daisuke
    Manjo, Taishun
    Hiraoka, Nozomu
    Taniguchi, Takashi
    Baron, Alfred Q. R.
    [J]. PHYSICAL REVIEW B, 2023, 108 (13)
  • [10] High-resolution x-ray absorption studies of core excitons in hexagonal boron nitride
    Li, Lu Hua
    Petravic, Mladen
    Cowie, Bruce C. C.
    Xing, Tan
    Peter, Robert
    Chen, Ying
    Si, Chen
    Duan, Wenhui
    [J]. APPLIED PHYSICS LETTERS, 2012, 101 (19)