Quantitative phase analysis of cubic boron nitride based composites by X-ray absorption near edge structure

被引：13
|
作者：
Piskorska, Edyta
Lawniczak-Jablonska, Krystyna
Minikayev, Roman
Wolska, Anna
Paszkowicz, Wojciech
Klimczyk, Piotr
Benko, Ewa
机构：
[1] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland
[2] Inst Met Cutting, PL-30011 Krakow, Poland
来源：
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2007年 / 62卷 / 05期
关键词：
cBN; composites; XANES; phase analysis;
D O I：
10.1016/j.sab.2007.04.003
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
X-ray absorption near edge structure (XANES) spectra of Ti, Si, B and N K-edges were investigated to determine the phase composition of multicompounds cubic boron nitride (cBN) based composites formed by reaction of cBN with Ti3SiC2 ceramics. Knowing that the shape of XANES spectra is a fingerprint of chemical bonding of the element in compound, a linear combination of XANES spectra of reference compounds (phases) was fitted to the spectra of the composites. This procedure permitted to determine the fraction of the componential phases in studied materials. X-ray Diffraction (XRD) analysis confirmed the presence of compounds detected by XANES analysis. The similarities and differences between XANES and XRD results are discussed. The combination of XANES and XRD techniques allowed to estimate the quantity of presented compounds within the limits of sensitivity of each method. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码：461 / 469
页数：9
相关论文
共 50 条
  • [1] Near-edge X-ray absorption fine structure spectroscopy of arcjet-deposited cubic boron nitride
    Berns, DH
    Cappelli, MA
    Shuh, DK
    [J]. DIAMOND AND RELATED MATERIALS, 1997, 6 (12) : 1883 - 1886
  • [2] The near edge structure of cubic boron nitride
    McCulloch, D. G.
    Lau, D. W. M.
    Nicholls, R. J.
    Perkins, J. M.
    [J]. MICRON, 2012, 43 (01) : 43 - 48
  • [3] Investigating the structure of boron nitride nanotubes by near-edge X-ray absorption fine structure (NEXAFS) spectroscopy
    Hemraj-Benny, T
    Banerjee, S
    Sambasivan, S
    Fischer, DA
    Han, WQ
    Misewich, JA
    Wong, SS
    [J]. PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2005, 7 (06) : 1103 - 1106
  • [4] Direct observation of defects in hexagonal boron nitride by near-edge X-ray absorption fine structure and X-ray photoemission spectroscopy
    Petravic, M.
    Peter, R.
    Fan, L. -J.
    Yang, Y. -W.
    Chen, Y.
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2010, 619 (1-3): : 94 - 97
  • [5] X-ray absorption studies on cubic boron nitride thin films
    Zhou, X. T.
    Sham, T. K.
    Zhang, W. J.
    Chan, C. Y.
    Bello, I.
    Lee, S. T.
    Hofsass, H.
    [J]. JOURNAL OF APPLIED PHYSICS, 2007, 101 (01)
  • [6] X-ray absorption studies on cubic boron nitride thin films
    Zhou, X.T.
    Sham, T.K.
    Zhang, W.J.
    Chan, C.Y.
    Bello, I.
    Lee, S.T.
    Hofsäss, H.
    [J]. Journal of Applied Physics, 2007, 101 (01):
  • [7] Polarization dependent X-ray absorption near-edge spectra of boron nitride nanotubes
    Kruger, Peter
    Maekawa, Yuya
    Hitchcock, Adam
    Bittencourt, Carla
    [J]. RADIATION PHYSICS AND CHEMISTRY, 2020, 175
  • [8] X-ray absorption studies of phase formation in a Ti/TiN coating on cubic boron nitride
    Piskorska, E
    Lawniczak-Jablonska, K
    Demchenko, IN
    Benko, E
    Welter, E
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2004, 362 (1-2) : 171 - 177
  • [9] A theoretical interpretation of near edge X-ray absorption fine structure of hexagonal boron nitride monolayer on Ni(111)
    Shimoyama, I.
    Baba, Y.
    Sekiguchi, T.
    Nath, K. G.
    [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2009, 175 (1-3) : 6 - 13
  • [10] X-ray diffraction analysis of aluminum nitride sintered with cubic boron nitride
    Bezhenar, NP
    Bozhko, SA
    Belyavina, NN
    Markiv, VY
    [J]. DIAMOND AND RELATED MATERIALS, 1997, 6 (08) : 927 - 930
12345