In this work, a novel asymmetric dielectric modulated dual short gate (ADMDG) TFET is designed and their performance was analysed. The ADMDG TFET using silicon, germanium, and SiGe as channel and source materials were simulated and results are compared with conventional DGTFET. The device simulation has been performed using Sentaurus TCAD simulator. It is found that the proposed structure provides overall improved performance for silicon TFET such as higher on-current (I-on = 4.2 mu A), smaller SS = 40mV/decade and maximum I-on/I-off ratio (8.2 x 10(10)) compared to conventional DGTFET. The on-current values obtained for SiGe source, Ge source and Ge channel ADMDG TFET are 0.22 mA, 0.69 mA and 0.14 mA respectively compared to silicon ADMDG TFET but compromises other dc parameters such as SS and I-on/I-off ratio. For CMOS circuits, the p-type silicon TFET of the proposed structure were also simulated and presented. Moreover, the proposed TFET structure is also simulated for different temperatures and its performance were compared and analysed. (C) 2017 Elsevier Ltd. All rights reserved.
机构:
Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Educ Minist, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Educ Minist, Xian 710071, Peoples R China
Wang, Aoxuan
Lu, Hongliang
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Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Educ Minist, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Educ Minist, Xian 710071, Peoples R China
Lu, Hongliang
Zhang, Yuming
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Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Educ Minist, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Educ Minist, Xian 710071, Peoples R China
Zhang, Yuming
Sun, Jiale
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Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Educ Minist, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Educ Minist, Xian 710071, Peoples R China
Sun, Jiale
Lv, Zhijun
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Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Educ Minist, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Educ Minist, Xian 710071, Peoples R China
机构:
Univ Delhi, Dept Elect Sci, Semicond Device Res Lab, New Delhi 110021, IndiaUniv Delhi, Dept Elect Sci, Semicond Device Res Lab, New Delhi 110021, India
Narang, Rakhi
Saxena, Manoj
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Univ Delhi, Deen Dayal Upadhyaya Coll, Dept Elect, New Delhi 110015, IndiaUniv Delhi, Dept Elect Sci, Semicond Device Res Lab, New Delhi 110021, India
Saxena, Manoj
Gupta, R. S.
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Maharaja Agrasen Inst Technol, Dept Elect & Commun Engn, New Delhi 110086, IndiaUniv Delhi, Dept Elect Sci, Semicond Device Res Lab, New Delhi 110021, India
机构:
Department of Electrical Engineering,Indian Institute of Technology Kanpur,Kanpur,Uttar Pradesh,208016,IndiaDepartment of Electrical Engineering,Indian Institute of Technology Kanpur,Kanpur,Uttar Pradesh,208016,India
机构:
Department of Electrical Engineering,Indian Institute of Technology Kanpur,Kanpur,Uttar Pradesh,,IndiaDepartment of Electrical Engineering,Indian Institute of Technology Kanpur,Kanpur,Uttar Pradesh,,India
MWAkram
Bahniman Ghosh
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Department of Electrical Engineering,Indian Institute of Technology Kanpur,Kanpur,Uttar Pradesh,,India
Microelectronics Research Center, Burnet Road,Bldg,University of Texas atDepartment of Electrical Engineering,Indian Institute of Technology Kanpur,Kanpur,Uttar Pradesh,,India