Tomographic Reconstruction in Atom Probe Microscopy: Past, Present ... Future?

被引：7
|
作者：
Gault, B. [1 ,2 ]
Moody, M. P. [2 ]
Marquis, E. A. [1 ]
de Geuser, F. [3 ]
Geiser, B. P. [4 ]
Larson, D. J. [4 ]
Kelly, T. F. [4 ]
Ringer, S. P. [2 ]
Smith, George D. W. [1 ]
机构：
[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
[2] Univ Sydney, Australian Key Ctr Microscopy & Microanal, Sydney, NSW 2006, Australia
[3] INP Grenoble, Lab Sci & Ingn Mat & Proc, CNRS, UMR 5266, F-38402 St Martin Dheres, France
[4] Imago Sci Instruments Corp, Madison, WI 53711 USA
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
D O I：
10.1017/S1431927609092988
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
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页码：10 / 11
页数：2
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