Partial scan methodologies -: A survey

被引：0
|
作者：
Kotásek, Z [1 ]
Ruzicka, R [1 ]
机构：
[1] Brno Univ Technol, Dept Comp Sci & Engn, Brno 61266, Czech Republic
来源：
PROGRAMMABLE DEVICES AND SYSTEMS | 2000年
关键词：
digital circuits; diagnostics; testability;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
In the paper the survey of partial scan methodologies is presented. Existing approaches for selecting FFs for partial scan can be classified as testability analysis based, test generation based and structural analysis based. In the paper, the results of our research activities are described as well. The methodology is based on such concepts as Test Input Register (TIR), Test Driver (TDR), Test Receiver (TRV), Test Output Register (TOR) and Test Transmitter (TTR). Copyright (C) 2000 IFAC.
引用
收藏
页码：135 / 139
页数：5
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