Improvements in TOF-SIMS analysis of organic materials using an indium liquid metal ion source.

被引：0
|
作者：
Bryan, SR [1 ]
Reich, F [1 ]
机构：
[1] PHYS ELECT INC,EDEN PRAIRIE,MN 55344
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1996年 / 211卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：323 / POLY
页数：1
相关论文
共 50 条
  • [1] Prospects for imaging with TOF-SIMS using gold liquid metal ion sources
    Walker, AV
    Winograd, N
    APPLIED SURFACE SCIENCE, 2003, 203 : 198 - 200
  • [2] ToF-SIMS analysis of organic impurities in UPW
    Kobayashi, J
    Owari, M
    SURFACE AND INTERFACE ANALYSIS, 2006, 38 (04) : 305 - 308
  • [3] ToF-SIMS depth profiling of organic solar cell layers using an Ar cluster ion source
    Smentkowski, Vincent S.
    Zorn, Gilad
    Misner, Amanda
    Parthasarathy, Gautam
    Couture, Aaron
    Tallarek, Elke
    Hagenhoff, Birgit
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2013, 31 (03):
  • [4] Using TOF-SIMS for the analysis of metal contamination on silicon wafers.
    Mowat, IA
    Schuerlein, T
    Metz, J
    Brigham, R
    Huffaker, D
    CLEANING TECHNOLOGY IN SEMICONDUCTOR DEVICE MANUFACTURING, 2000, 99 (36): : 561 - 568
  • [5] TOF-SIMS and XPS analysis of ancient and forensic materials
    Lee, Yeonhee
    Lee, Jihye
    Ham, Seung Wook
    Lee, Kangbong
    Kim, Kang-Jin
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2009, 237 : 207 - 207
  • [6] TOF-SIMS analysis of ion-water interactions
    Souda, R
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2005, 232 : 125 - 133
  • [7] SURFACE-ANALYSIS OF ORGANIC MATERIAL WITH TOF-SIMS
    HERCULES, DM
    JOURNAL OF MOLECULAR STRUCTURE, 1993, 292 : 49 - 63
  • [8] ANALYSIS OF LIGNIN STRUCTURE USING TOF-SIMS
    Matsushita, Yasuyuki
    Ioka, Kousuke
    Saito, Kaori
    Takama, Ruka
    Aoki, Dan
    Fukushima, Kazuhiko
    PROCEEDING OF THE 4TH INTERNATIONAL CONFERENCE ON PULPING, PAPERMAKING AND BIOTECHNOLOGY (ICPPB '12), VOLS. I AND II, 2012, : 100 - 102
  • [9] Progress in cellular analysis using ToF-SIMS
    Lockyer, NP
    Vickerman, JC
    APPLIED SURFACE SCIENCE, 2004, 231 : 377 - 384
  • [10] The chemical analysis of wood using ToF-SIMS
    Fukushima, Kazuhiko
    Saito, Kaori
    MOKUZAI GAKKAISHI, 2007, 53 (06): : 291 - 297
12345