Improvements in TOF-SIMS analysis of organic materials using an indium liquid metal ion source.

被引：0
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作者：
Bryan, SR [1 ]
Reich, F [1 ]
机构：
[1] PHYS ELECT INC,EDEN PRAIRIE,MN 55344
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1996年 / 211卷
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中图分类号：
O6 [化学];
学科分类号：
0703 ;
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页码：323 / POLY
页数：1
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