On the load-pull effect in MMIC oscillator measurements

被引：7
|
作者：
Schott, M [1 ]
Lenk, F [1 ]
Heymann, P [1 ]
机构：
[1] Ferdinand Braun Inst Hochstfrequentech, D-12489 Berlin, Germany
来源：
33RD EUROPEAN MICROWAVE CONFERENCE, VOLS 1-3, CONFERENCE PROCEEDINGS | 2003年
关键词：
D O I：
10.1109/EUMA.2003.340966
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Low phase-noise MMIC oscillators are key components for microwave and mm-wave systems. As a consequence, phase-noise measurements of these circuits have become a subject of growing interest and importance. This paper demonstrates that MMIC oscillator circuits with their relatively low Q factors are prone to specific measurement errors. Caused by a load-pull effect, the measurement system can become part of the oscillator, which yields phase-noise data significantly below reality. Special care has to be taken in order to avoid such phenomena.
引用
收藏
页码：367 / 370
页数：4
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