Finding of optimal excitation signal for testing of analog electronic circuits

被引：0

作者：

Chruszczyk, L. ^{[1
]}

Grzechca, D. ^{[1
]}

Rutkowski, J. ^{[1
]}

机构：

[1] Silesian Tech Univ, Fac Automat Control Elect & Comp Sci, PL-44100 Gliwice, Poland

来源：

BULLETIN OF THE POLISH ACADEMY OF SCIENCES-TECHNICAL SCIENCES | 2007年 / 55卷 / 03期

关键词：

fault detection; fault location; dictionary fault diagnosis; analog electronic circuits; wavelet transform; genetic algorithm;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This article presents combined approach to analog electronic circuits testing by means of evolutionary methods (genetic algorithms) and using some aspects of information theory utilisation and wavelet transformation. Purpose is to find optimal excitation signal, which maximises probability of fault detection and location. This paper focuses on most difficult case where very few (usually only input and output) nodes of integrated circuit under test are available.

引用

页码：273 / 280

页数：8

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