Monitoring quantum dot growth by in-situ cantilever systems

被引：0
|
作者：
Duan, H. L. [1 ]
Wang, Y. [1 ]
Yi, X. [1 ]
机构：
[1] Forschungszentrum Karlsruhe, Inst Nanotechnol, D-76021 Karlsruhe, Germany
来源：
ADVANCES IN HETEROGENEOUS MATERIAL MECHANICS 2008 | 2008年
关键词：
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
引用
收藏
页码：11 / 11
页数：1
相关论文
共 50 条
  • [21] Development of In-situ Monitoring System for Crop Growth Observation
    Murakami, Hideki
    Tanaka, Yoshiki
    Yamashita, Jun-ichi
    Takeshita, Rikako
    Sakane, Yasunori
    Okamoto, Takumi
    Koide, Tetsushi
    2019 2ND INTERNATIONAL SYMPOSIUM ON DEVICES, CIRCUITS AND SYSTEMS (ISDCS 2019), 2019,
  • [22] IN-SITU MONITORING OF METAL MULTILAYER GROWTH BY OPTICAL REFLECTOMETRY
    DODD, PM
    LUNNEY, JG
    ARMSTRONG, JV
    OPTICAL ENGINEERING, 1994, 33 (12) : 3969 - 3973
  • [23] In-situ monitoring of the growth of nanostructured aluminum thin film
    Novotny, Michal
    Bulir, Jiri
    Lancok, Jan
    Pokorny, Petr
    Bodnar, Michal
    JOURNAL OF NANOPHOTONICS, 2011, 5
  • [24] In-situ monitoring and control for MOCVD growth of AlGaAs and InGaAs
    A. Kussmaul
    S. Vernon
    P. C. Colter
    R. Sudharsanan
    A. Mastrovito
    K. J. Linden
    N. H. Karam
    N. H. Karam
    S. C. Warnick
    M. A. Dahleh
    Journal of Electronic Materials, 1997, 26 : 1145 - 1153
  • [25] An in-situ monitoring system for characterizing porous silicon growth
    Wyndham, David
    James, Tim
    Lim, Gene
    Parish, Gia
    Musca, Charlie
    Keating, Adrian
    SMART MATERIALS V, 2008, 7267
  • [26] In-situ monitoring and control for MOCVD growth of AlGaAs and InGaAs
    Kussmaul, A
    Vernon, S
    Colter, PC
    Sudharsanan, R
    Mastrovito, A
    Linden, KJ
    Karam, NH
    Warnick, SC
    Dahleh, MA
    JOURNAL OF ELECTRONIC MATERIALS, 1997, 26 (10) : 1145 - 1153
  • [27] In-situ monitoring of crystal growth in LPE using microprocessor
    Patel, SA
    Chaudhari, CB
    Gautam, DK
    IETE TECHNICAL REVIEW, 1998, 15 (1-2) : 21 - 26
  • [28] IN-SITU MONITORING OF ELECTROEPITAXIAL GROWTH OF THICK ALGAAS LAYERS
    ZYTKIEWICZ, ZR
    ACTA PHYSICA POLONICA A, 1993, 84 (04) : 777 - 780
  • [29] From In Situ Characterization to Process Control of Quantum Dot Systems
    Segets, Doris
    Peukert, Wolfgang
    NEW PARADIGM OF PARTICLE SCIENCE AND TECHNOLOGY, PROCEEDINGS OF THE 7TH WORLD CONGRESS ON PARTICLE TECHNOLOGY, 2015, 102 : 575 - 581
  • [30] In-situ polymer buildup monitoring in plasma etching systems
    Kim, JS
    Wise, KD
    Grizzle, JW
    1997 IEEE INTERNATIONAL SYMPOSIUM ON SEMICONDUCTOR MANUFACTURING CONFERENCE PROCEEDINGS, 1997, : B37 - B40
12345