TEM investigations of Si ion-implanted GaN

被引:0
|
作者
Zou, J [1 ]
Cockayne, DJH [1 ]
Duan, XF [1 ]
Tan, HH [1 ]
Williams, JS [1 ]
Pearton, SJ [1 ]
Stall, SA [1 ]
机构
[1] Univ Sydney, Australian Key Ctr Microscopy & Microanal, Sydney, NSW 2006, Australia
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中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
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页码:481 / 482
页数:2
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