Simulated and developed an electron impact ionization source for space miniature time-of-flight mass spectrometer

被引:10
|
作者
Ren, Zhengyi [1 ]
Guo, Meiru [1 ]
Cheng, Yongjun [1 ]
Sun, Wenjun [1 ]
Dong, Meng [1 ]
Li, Gang [1 ]
Pei, Xiaoqiang [1 ]
Wu, Chengyao [1 ]
机构
[1] Lanzhou Inst Phys, Sci & Technol Vacuum Technol & Phys Lab, Lanzhou 730000, Peoples R China
基金
中国国家自然科学基金;
关键词
EI source; Phase space; SIMION; 8.1; simulation; RTOF MS; ION;
D O I
10.1016/j.vacuum.2020.109207
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Based on the ions initial distribution and electrodes parameters of electron impact (EI) ionization source, the physical model of miniature EI source is developed by SIMION 8.1. By using the phase space analysis method, we have researched the influence of the initial position of ions voltage parameters of electrodes on focusing performance, ion transmission efficiency and velocity distribution of ions when they exited from the focusing electrode. It is found that when negative voltage is applied to the object slit S of the EI source, the position and velocity distributions of the ions at the exit are minimized, the performance of the EI source is greatly improved due to the secondary focusing of the ions in this case. Based on the above research, we developed the integrated EI source, the EI source's overall size is 12 mm wide, 24 mm long and 12 mm tall, it weighs 0.1 kg, and its power consumption was measured to be 1 W. Finally, the primary performance of the EI source coupled to reflection time-of-flight mass spectrometer (RTOF MS) is evaluated and the experiment results are consistent with simulation results.
引用
下载
收藏
页数:8
相关论文
共 50 条
  • [11] Development of a miniature time-of-flight mass/charge spectrometer for ion beam source analyzing
    Huang, Zhengxu
    Tan, Guobin
    Zhou, Zhen
    Chen, Lei
    Cheng, Liang
    Jin, Dazhi
    Tan, Xiaohua
    Xie, Chunguang
    Li, Lei
    Dong, Junguo
    Fu, Zhong
    Cheng, Ping
    Gao, Wei
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 2015, 379 : 60 - 64
  • [12] Hyperthermal surface ionization in a time-of-flight mass spectrometer
    Weickhardt, C
    Draack, L
    Grotemeyer, J
    EUROPEAN JOURNAL OF MASS SPECTROMETRY, 2000, 6 (04) : 319 - 323
  • [13] LASER-INDUCED ELECTRON-IMPACT IONIZATION IN A REFLECTRON TIME-OF-FLIGHT MASS-SPECTROMETER
    MORITZ, F
    DEY, M
    ZIPPERER, K
    PRINKE, S
    GROTEMEYER, J
    ORGANIC MASS SPECTROMETRY, 1993, 28 (12): : 1467 - 1475
  • [14] Electron impact dissociative ionization of CO2:: Measurements with a focusing time-of-flight mass spectrometer
    Tian, CC
    Vidal, CR
    JOURNAL OF CHEMICAL PHYSICS, 1998, 108 (03): : 927 - 936
  • [15] OPERATION AND MASS RESOLUTION OF A TIME-OF-FLIGHT MASS-SPECTROMETER WITH ELECTRON-IMPACT IONIZATION AND RAPID FIELD REVERSAL
    HOLMLID, L
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1984, 59 (03): : 247 - 259
  • [16] A combined single photon ionization and photoelectron ionization source for orthogonal acceleration time-of-flight mass spectrometer
    Wu, Qinghao
    Hua, Lei
    Hou, Keyong
    Cui, Huapeng
    Chen, Ping
    Wang, Weiguo
    Li, Jinghua
    Li, Haiyang
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 2010, 295 (1-2) : 60 - 64
  • [17] CONTINUOUS ION SOURCE FOR A TIME-OF-FLIGHT MASS SPECTROMETER
    STUDIER, MH
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1963, 34 (12): : 1367 - &
  • [18] Radiofrequency field enhanced chemical ionization with vacuum ultraviolet lamp for miniature time-of-flight mass spectrometer
    Lijuan Zhou
    Jichun Jiang
    Kun Zhao
    Jinxu Li
    Chenxin Wu
    Haiyang Li
    Di Tian
    Keyong Hou
    Chinese Chemical Letters, 2018, 29 (05) : 707 - 710
  • [19] Radiofrequency field enhanced chemical ionization with vacuum ultraviolet lamp for miniature time-of-flight mass spectrometer
    Zhou, Lijuan
    Jiang, Jichun
    Zhao, Kun
    Li, Jinxu
    Wu, Chenxin
    Li, Haiyang
    Tian, Di
    Hou, Keyong
    CHINESE CHEMICAL LETTERS, 2018, 29 (05) : 707 - 710
  • [20] Electrospray ionization time-of-flight mass spectrometer for elemental analysis
    Mahoney, PP
    Guzowski, JP
    Ray, SJ
    Hieftje, GM
    APPLIED SPECTROSCOPY, 1997, 51 (10) : 1464 - 1470