Considerations in Solution Stabilization for Thermal Fatigue Modeling of Lead-free Solder Joints

被引:0
|
作者
Chan, Y. Sing [1 ]
Lee, S. W. Ricky [1 ]
机构
[1] Hong Kong Univ Sci & Technol, Elect Packaging Lab, Ctr Adv Microsyst Packaging, Kowloon, Hong Kong, Peoples R China
关键词
LIFE;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The acquisition of a "stabilized" solution is necessary for the consistent evaluation of the solder joint thermal fatigue damage by the common finite element (FE) based modeling approaches. Yet, there are no universal guidelines developed for this purpose. The present study aims to provide insight into this subject. A 1-D analytical model is firstly developed for this study. The balance between the "forward creep strain" and the "backward creep strain" is observed to be the driving force that leads to solution stabilization of the 1-D model. Considerations are then made for the 2-D and 3-D cases. It is found that there is discrepancy in the solution behavior between the 1-D and the multi-dimensional situations. Accordingly, the von Mises creep strain may not appropriately reflect the stabilization status of the multidimensional models. The von Mises stress, therefore, is proposed to serve the purpose instead. A set of stabilization criteria is developed eventually. These criteria are expected to be universally applicable to all 2-D and 3-D solder joint thermal fatigue problems. As a demonstration, the criteria are implemented on a 2-D model for which the solder joint thermal fatigue damage of a custom-made assembly is evaluated. All analyses presented in this paper are based on the SnAgCu (SAC) lead-free solder.
引用
收藏
页码:1070 / 1078
页数:9
相关论文
共 50 条
  • [1] Fatigue Properties of Lead-free Doped Solder Joints
    Su, Sinan
    Akkara, Francy John
    Abueed, Mohammed
    Jian, Minghong
    Hamasha, Sa'd
    Suhling, Jeff
    Lall, Pradeep
    PROCEEDINGS OF THE 17TH IEEE INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS (ITHERM 2018), 2018, : 1243 - 1248
  • [2] Fatigue crack growth in lead-free solder joints
    Omiya, Masaki
    Kishimoto, Kikuo
    Anagni, Masazurni
    EMAP 2005: International Symposium on Electronics Materials and Packaging, 2005, : 232 - 237
  • [3] Shear and Fatigue Properties of Lead-Free Solder Joints: Modeling and Microstructure Analysis
    Wei, Xin
    Belhadi, Mohamed El Amine
    Hamasha, Sa'd
    Alahmer, Ali
    Zhao, Rong
    Prorok, Bart
    Sakib, A. R. Nazmus
    JOURNAL OF ELECTRONIC PACKAGING, 2023, 145 (02)
  • [4] Effect of void formation on thermal fatigue reliability of lead-free solder joints
    Kim, DS
    Yu, Q
    Shibutani, T
    Sadakata, N
    Inoue, T
    ITHERM 2004, VOL 2, 2004, : 325 - 329
  • [5] A comparative study on thermal and mechanical fatigue Behavior for lead-free solder joints
    Kim, Ilho
    Lee, Soon-Bok
    2006 INTERNATIONAL CONFERENCE ON ELECTRONIC MATERIALS AND PACKAGING, VOLS 1-3, 2006, : 491 - 511
  • [6] Accelerated thermal fatigue of lead-free solder joints as a function of reflow cooling rate
    Qi, Y
    Zbrzezny, AR
    Agia, M
    Lam, R
    Ghorbani, HR
    Snugovsky, P
    Perovic, DD
    Spelt, JK
    JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (12) : 1497 - 1506
  • [7] Accelerated thermal fatigue of lead-free solder joints as a function of reflow cooling rate
    Y. Qi
    A. R. Zbrzezny
    M. Agia
    R. Lam
    H. R. Ghorbani
    P. Snugovsky
    D. D. Perovic
    J. K. Spelt
    Journal of Electronic Materials, 2004, 33 : 1497 - 1506
  • [8] Fatigue Behaviour of Lead-Free Solder Joints Under Combined Thermal and Vibration Loads
    Meier, Karsten
    Winkler, Maria
    Bock, Karlheinz
    Leslie, David
    Dasgupta, Abhijit
    2019 IEEE 69TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2019, : 498 - 504
  • [9] Modeling Microstructure Effects on Electromigration in Lead-free Solder Joints
    Ni, Jiamin
    Liu, Yong
    Hao, Jifa
    Maniatty, Antoinette
    O'Connell, Barry
    2014 IEEE 64TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2014, : 1241 - 1246
  • [10] A method to determine the slip systems in BGA lead-free solder joints during thermal fatigue
    Tan, Shihai
    Han, Jing
    Wang, Yan
    Guo, Fu
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2018, 29 (09) : 7501 - 7509