Considerations in Solution Stabilization for Thermal Fatigue Modeling of Lead-free Solder Joints

被引:0
|
作者
Chan, Y. Sing [1 ]
Lee, S. W. Ricky [1 ]
机构
[1] Hong Kong Univ Sci & Technol, Elect Packaging Lab, Ctr Adv Microsyst Packaging, Kowloon, Hong Kong, Peoples R China
关键词
LIFE;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The acquisition of a "stabilized" solution is necessary for the consistent evaluation of the solder joint thermal fatigue damage by the common finite element (FE) based modeling approaches. Yet, there are no universal guidelines developed for this purpose. The present study aims to provide insight into this subject. A 1-D analytical model is firstly developed for this study. The balance between the "forward creep strain" and the "backward creep strain" is observed to be the driving force that leads to solution stabilization of the 1-D model. Considerations are then made for the 2-D and 3-D cases. It is found that there is discrepancy in the solution behavior between the 1-D and the multi-dimensional situations. Accordingly, the von Mises creep strain may not appropriately reflect the stabilization status of the multidimensional models. The von Mises stress, therefore, is proposed to serve the purpose instead. A set of stabilization criteria is developed eventually. These criteria are expected to be universally applicable to all 2-D and 3-D solder joint thermal fatigue problems. As a demonstration, the criteria are implemented on a 2-D model for which the solder joint thermal fatigue damage of a custom-made assembly is evaluated. All analyses presented in this paper are based on the SnAgCu (SAC) lead-free solder.
引用
收藏
页码:1070 / 1078
页数:9
相关论文
共 50 条
  • [31] Reliability Testing of Lead-Free Solder Joints
    Bazu, Marius
    Ilian, Virgil Emil
    Galateanu, Lucian
    Varsescu, Dragos
    Pietrikova, Alena
    2012 35TH INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY (ISSE 2012): POWER ELECTRONICS, 2012, : 173 - 177
  • [32] Electromigration issues in lead-free solder joints
    Chen, Chih
    Liang, S. W.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2007, 18 (1-3) : 259 - 268
  • [33] The creep properties of lead-free solder joints
    Song, H.G.
    Morris Jr., J.W.
    Hua, F.
    JOM, 2002, 54 (06) : 30 - 32
  • [34] How good are lead-free solder joints?
    Melton, Cindy
    Surface mount technology, 1995, 9 (06):
  • [35] Thermal fatigue analysis of a CBGA package with lead-free solder fillets
    Hong, BZ
    ITHERM '98: SIXTH INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS, 1998, : 205 - 211
  • [36] Thermal and bending fatigue of PBGA assemblies with lead-free solder pastes
    Jonnalagadda, K
    Bai, T
    Olson, B
    2001 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, PROCEEDINGS, 2001, 4587 : 553 - 558
  • [37] Intergranular thermal fatigue damage evolution in SnAgCu lead-free solder
    Erinc, M.
    Schreurs, P. J. G.
    Geers, M. G. D.
    MECHANICS OF MATERIALS, 2008, 40 (10) : 780 - 791
  • [38] Arrhenius Fatigue Life Modeling for Lead-Free Solder Joints in Accelerated Combined Fatigue and Creep Tests at Different Operating Temperatures
    Al Athamneh, Raed
    Hani, Dania Bani
    Hamasha, Sa'd
    Abueed, Mohammed
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2023, 13 (03): : 332 - 345
  • [39] Reliability of lead-free solder joints in CSP device under thermal cycling
    Liang Zhang
    Lei Sun
    Yong-huan Guo
    Cheng-wen He
    Journal of Materials Science: Materials in Electronics, 2014, 25 : 1209 - 1213
  • [40] Reliability of lead-free solder joints in CSP device under thermal cycling
    Zhang, Liang
    Sun, Lei
    Guo, Yong-huan
    He, Cheng-wen
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2014, 25 (03) : 1209 - 1213