A new class of Ti-Si-C-N coatings obtained by chemical vapor deposition - part II: low-temperature process

被引:0
|
作者
Kuo, DH [1 ]
Huang, KW [1 ]
机构
[1] Natl Dong Hwa Univ, Inst Mat Sci & Engn, Shoufeng, Hualien, Peoples R China
关键词
Ti-Si-C-N coatings; chemical vapor deposition; low-temperature;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A new class of the Ti-Si-C-N coatings obtained by chemical vapor deposition with TiCl4, SiCl4, C2H2, H-2, and N-2 as reactants have been further examined in this study. The effects of deposition temperatures have been explored in the range of 700-1100 degreesC. The resulting deposits have a non-stoichiometric TiC structure as a (Ti,Si)(C,N) solid solution. Large, dense, well-crystallized, and faceted crystals with a hardness value of similar to 10 GPa can be obtained at deposition temperature as low as 800 degreesC. The Si content is barely detectable in the coatings deposited at 800 degreesC, but increases as the deposition temperatures increase from 800 to 1100 degreesC. Coatings of a hardness value of 27.5 GPa are obtained for a coating deposited at 1100 degreesC. Furthermore, the effects of TiCl4 and SiCl4 flows at a deposition temperature of 800 degreesC have also been studied. The data for growth rate and composition can be best described by the absorption/surface coverage behavior and the relatively low reactivity of SiCl4 at low temperatures. Finally, the effects of H-2 and N-2 at deposition temperature of 800 degreesC have been studied. Deposits form at higher H-2 input and improve when sufficient N2 is also added. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:81 / 89
页数:9
相关论文
共 50 条
  • [41] Microstructure and properties of Ti(C,N) coatings produced by moderate temperature chemical vapour deposition
    Larsson, A
    Ruppi, S
    THIN SOLID FILMS, 2002, 402 (1-2) : 203 - 210
  • [42] LOW-TEMPERATURE CHEMICAL VAPOR-DEPOSITION OF EPITAXIAL SI AND SIGE LAYERS AT ATMOSPHERIC-PRESSURE
    DEBOER, WB
    MEYER, DJ
    APPLIED PHYSICS LETTERS, 1991, 58 (12) : 1286 - 1288
  • [43] Epitaxial film thickness in the low-temperature growth of Si(100) by plasma enhanced chemical vapor deposition
    Varhue, WJ
    Rogers, JL
    Andry, PS
    Adams, E
    APPLIED PHYSICS LETTERS, 1996, 68 (03) : 349 - 351
  • [45] EPITAXIAL-GROWTH OF BETA-SIC ON SI BY LOW-TEMPERATURE CHEMICAL VAPOR-DEPOSITION
    CHAUDHRY, MI
    WRIGHT, RL
    JOURNAL OF MATERIALS RESEARCH, 1990, 5 (08) : 1595 - 1598
  • [46] Hydrogen-mediated low-temperature epitaxy of Si in plasma-enhanced chemical vapor deposition
    Kitagawa, T
    Kondo, M
    Matsuda, A
    APPLIED SURFACE SCIENCE, 2000, 159 : 30 - 34
  • [47] EPITAXY AND DOPING OF SI AND SI1-XGEX AT LOW-TEMPERATURE BY RAPID THERMAL CHEMICAL-VAPOR-DEPOSITION
    DUTARTRE, D
    WARREN, P
    SAGNES, I
    BADOZ, PA
    PERIO, A
    DUPUIS, JC
    PRUDON, G
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (03): : 1134 - 1139
  • [48] Growth and characterization of low-temperature Si1-xSnx on Si using plasma enhanced chemical vapor deposition
    Banihashemian, Seyedeh Fahimeh
    Grant, Joshua M.
    Sabbar, Abbas
    Tran, Huong
    Olorunsola, Oluwatobi
    Ojo, Solomon
    Amoah, Sylvester
    Mehboudi, Mehrshad
    Yu, Shui-Qing
    Mosleh, Aboozar
    Naseem, Hameed A.
    OPTICAL MATERIALS EXPRESS, 2020, 10 (09) : 2242 - 2253
  • [49] Low temperature inorganic chemical vapor deposition of Ti-Si-N diffusion barrier liners for gigascale copper interconnect applications
    Eisenbraun, E
    Upham, A
    Dash, R
    Zeng, WX
    Hoefnagels, J
    Lane, S
    Anjum, D
    Dovidenko, K
    Kaloyeros, A
    Arkles, B
    Sullivan, JJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (04): : 2011 - 2015
  • [50] New approach to low-temperature epitaxial growth of GaAs by photostimulated metalorganic chemical vapor deposition
    Kachi, Tetsu
    Ito, Hiroshi
    Terada, Shigeo
    Japanese Journal of Applied Physics, Part 2: Letters, 1988, 27 (08):