Methods of Coherent X-Ray Diffraction Imaging

被引：8
|
作者：
Prosekov, P. A. [1 ]
Nosik, V. L. [1 ,3 ]
Blagov, A. E. [2 ]
机构：
[1] Russian Acad Sci, Fed Sci Res Ctr Crystallog & Photon, Shubnikov Inst Crystallog, Moscow 119333, Russia
[2] Kurchatov Inst, Natl Res Ctr, Moscow 123182, Russia
[3] Natl Res Nucl Univ MEPhI, Moscow Engn Phys Inst, Moscow 115409, Russia
来源：
CRYSTALLOGRAPHY REPORTS | 2021年 / 66卷 / 06期
基金：
俄罗斯基础研究基金会;
关键词：
FREE-ELECTRON LASER; SPECKLE VISIBILITY SPECTROSCOPY; PHOTON-CORRELATION SPECTROSCOPY; FOURIER PHASE PROBLEMS; ORIENTATIONAL ORDER; LOCAL-STRUCTURE; SCATTERING; RETRIEVAL; RESOLUTION; MICROSCOPY;
D O I：
10.1134/S1063774521060286
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
Methods of coherent X-ray diffraction imaging of the spatial structure of noncrystalline objects and nanocrystals (nanostructures) are considered. Particular attention is paid to the methods of scanning-based coherent diffraction imaging (ptychography), visualization based on coherent surface scattering with application of correlation spectroscopy approaches, and specific features of visualization using X-ray free-electron laser radiation. The corresponding data in the literature are analyzed to demonstrate the state of the art of the methods of coherent diffraction imaging and fields of their application.
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页码：867 / 882
页数：16
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