Methods for obtaining superresolution images in coherent x-ray diffraction microscopy

被引：3
|
作者：
Takahashi, Yukio [1 ]
Nishino, Yoshinori [1 ]
Ishikawa, Tetsuya [1 ]
机构：
[1] Osaka Univ, Grad Sch Engn, Frontier Res Base Global Young Researchers, Suita, Osaka 5650871, Japan
来源：
PHYSICAL REVIEW A | 2007年 / 76卷 / 03期
关键词：
D O I：
10.1103/PhysRevA.76.033822
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Coherent x-ray diffraction microscopy (CXDM) using an x-ray free electron laser (XFEL) is expected to open up a new frontier of structural studies in materials science and biology, while radiation damage of samples under the extremely intense x rays is a matter of considerable concern. Two superresolution methods for CXDM proposed in this paper offer solutions of the problems by numerical data analysis. Promising results for future applications of CXDM with XFEL were obtained in a numerical simulation.
引用
收藏
页数：4
相关论文
共 50 条
  • [1] Methods of Coherent X-Ray Diffraction Imaging
    P. A. Prosekov
    V. L. Nosik
    A. E. Blagov
    Crystallography Reports, 2021, 66 : 867 - 882
  • [2] Methods of Coherent X-Ray Diffraction Imaging
    Prosekov, P. A.
    Nosik, V. L.
    Blagov, A. E.
    CRYSTALLOGRAPHY REPORTS, 2021, 66 (06) : 867 - 882
  • [3] Coherent X-ray diffraction microscopy of extended objects
    Pfeiffer, Franz
    Thibault, Pierre
    Dierolf, Martin
    Menzel, Andreas
    Kewish, Cameron
    David, Christian
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2008, 64 : C119 - C119
  • [4] Development of incident x-ray flux monitor for coherent x-ray diffraction microscopy
    Takahashi, Yukio
    Kubo, Hideto
    Furukawa, Hayato
    Yamauchi, Kazuto
    Matsubara, Eiichiro
    Ishikawa, Tetsuya
    Nishino, Yoshinori
    9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 2009, 186
  • [5] Erratum to:Methods of Coherent X-Ray Diffraction Imaging
    P. A. Prosekov
    V. L. Nosik
    A. E. Blagov
    Crystallography Reports, 2022, 67 : 311 - 311
  • [6] Three-Dimensional Coherent X-Ray Diffraction Microscopy
    Ian K. Robinson
    Jianwei Miao
    MRS Bulletin, 2004, 29 : 177 - 181
  • [7] Hard x-ray nanobeam characterization by coherent diffraction microscopy
    Schropp, A.
    Boye, P.
    Feldkamp, J. M.
    Hoppe, R.
    Patommel, J.
    Samberg, D.
    Stephan, S.
    Giewekemeyer, K.
    Wilke, R. N.
    Salditt, T.
    Gulden, J.
    Mancuso, A. P.
    Vartanyants, I. A.
    Weckert, E.
    Schoeder, S.
    Burghammer, M.
    Schroer, C. G.
    APPLIED PHYSICS LETTERS, 2010, 96 (09)
  • [8] Hard X-Ray Scanning Microscopy with Coherent Diffraction Contrast
    Schroer, C. G.
    Schropp, A.
    Boye, P.
    Hoppe, R.
    Patommel, J.
    Hoenig, S.
    Samberg, D.
    Stephan, S.
    Schoeder, S.
    Burghammer, M.
    Wellenreuther, G.
    Falkenberg, G.
    10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 2011, 1365 : 227 - 230
  • [9] Three-dimensional coherent x-ray diffraction microscopy
    Robinson, IK
    Miao, JW
    MRS BULLETIN, 2004, 29 (03) : 177 - 181
  • [10] High-resolution scanning coherent X-ray diffraction microscopy
    Thibault, P.
    Dierolf, M.
    Menzel, A.
    Bunk, O.
    Pfeiffer, F.
    UVX 2008: 9E COLLOQUE SUR LES SOURCES COHERENTES ET INCOHERENTES UV, VUV ET X; APPLICATIONS ET DEVELOPPEMENTS RECENTS, 2008, : 145 - 149
12345